The role of metal and passivation defects in...

Thin Solid Films 1982 Vol. 93; Iss. 3-4

The role of metal and passivation defects in electromigration-induced damage in thin film conductors

J.R. Lloyd, P.M. Smith, G.S. Prokop
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Volume:
93
Year:
1982
Language:
english
Pages:
11
DOI:
10.1016/0040-6090(82)90144-4
File:
PDF, 866 KB
english, 1982
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