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Volume 93; Issue 3-4
Main
Thin Solid Films
Volume 93; Issue 3-4
Thin Solid Films
Volume 93; Issue 3-4
1
Analysis of surface structural defects by low energy electron diffraction
D.G. Welkie
,
M.G. Lagally
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 930 KB
Your tags:
english, 1982
2
Radioactive Ni∗ tracer study of the nickel silicide growth mechanism
J.E.E. Baglin
,
H.A. Atwater
,
D. Gupta
,
F.M. D'Heurle
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 561 KB
Your tags:
english, 1982
3
Comparison of the three classes (rare earth, refractory and near-noble) of silicide contacts
R.D. Thompson
,
K.N. Tu
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 683 KB
Your tags:
english, 1982
4
Formation and growth of voids and/or gas bubbles in thin films
J.R. Lloyd
,
S. Nakahara
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 395 KB
Your tags:
english, 1982
5
Structure and performance of polycrystalline thin film solar cells
Edward S. Yang
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 688 KB
Your tags:
english, 1982
6
Magnetron-sputtered metal-amorphous silicon interfaces
W.W. Anderson
,
J.L. Crowley
,
A.D. Jonath
,
H.F. Macmillan
,
W.G. Opyd
,
J.A. Thornton
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 305 KB
Your tags:
english, 1982
7
Studies of interface states of silicon metal-oxide-semiconductor devices by dynamic conductance and noise measurements and effects of bias-temperature stresses
K.L. Ngai
,
S.T. Liu
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 610 KB
Your tags:
english, 1982
8
Effects of interface structure on the electrical characteristics of PtSi-Si Schottky barrier contacts
B.-Y. Tsaur
,
D.J. Silversmith
,
R.W. Mountain
,
C.H. Anderson Jr.
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 694 KB
Your tags:
english, 1982
9
New developments in the defect structure of implanted furnace-annealed silicon on sapphire
Eliezer Dovid Richmond
,
Alvin R. Knudson
,
Tom J. Magee
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 855 KB
Your tags:
english, 1982
10
The role of metal and passivation defects in electromigration-induced damage in thin film conductors
J.R. Lloyd
,
P.M. Smith
,
G.S. Prokop
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 866 KB
Your tags:
english, 1982
11
Applications of TiN thin films in silicon device technology
M. Wittmer
,
H. Melchior
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 487 KB
Your tags:
english, 1982
12
Reduction in the effective barrier height in PtSi-p-Si Schottky diodes by using low energy ion implantation
C.-Y. Wei
,
W. Tantraporn
,
W. Katz
,
G. Smith
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 273 KB
Your tags:
english, 1982
13
Oxide barriers to the formation of refractory silicides
D.J. Silversmith
,
D.D. Rathman
,
R.W. Mountain
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 376 KB
Your tags:
english, 1982
14
Author index
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 36 KB
Your tags:
english, 1982
15
Contents of volume 93
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 112 KB
Your tags:
english, 1982
16
Flash-evaporated Cr-SiO resistive elements
E. Schabowska
,
Z. Porada
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 177 KB
Your tags:
english, 1982
17
Quantifying delineation errors in thin film resistors I: Evaluation of linewidth errors from resistance measurements
A. Peled
,
M. Haspel
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 197 KB
Your tags:
english, 1982
18
The direct observation of atomic surface structure and inclined planar defects in Au(111) films
William Krakow
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 1.73 MB
Your tags:
english, 1982
19
Differences between the growth kinetics of thin film and bulk diffusion couples
U. Gösele
,
K.N. Tu
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 30 KB
Your tags:
english, 1982
20
Formation of intermetallics and grain boundary diffusion in Cu-Al and Au-Al thin film couples
J.M. Vandenberg
,
F.J.A. Den Broeder
,
R.A. Hamm
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 182 KB
Your tags:
english, 1982
21
Electron beam study of silicide Schottky diodes
H.-C.W. Huang
,
C.F. Aliotta
,
P.S. Ho
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 703 KB
Your tags:
english, 1982
22
Effects of grain boundaries on the resistivity of co-sputtered WSi2 films
D.R. Campbell
,
S. Mader
,
W.K. Chu
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 288 KB
Your tags:
english, 1982
23
Silicide applications in microelectronics
Billy L. Crowder
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 41 KB
Your tags:
english, 1982
24
Metallization for very-large-scale integrated circuits
P.B. Ghate
Journal:
Thin Solid Films
Year:
1982
Language:
english
File:
PDF, 2.00 MB
Your tags:
english, 1982
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