Development and confirmation of the unified model for...

Thin Solid Films 1982 Vol. 89; Iss. 4

Development and confirmation of the unified model for Schottky barrier formation and MOS interface states on III-V compounds

W.E. Spicer, S. Eglash, I. Lindau, C.Y. Su, P.R. Skeath
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Volume:
89
Year:
1982
Language:
english
Pages:
14
DOI:
10.1016/0040-6090(82)90325-x
File:
PDF, 866 KB
english, 1982
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