Volume 89; Issue 4

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Thin Solid Films
Volume 89; Issue 4

Thin Solid Films

Volume 89; Issue 4

1

Generation of interface states in MOS systems

P. Balk, N. Klein

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 669 KB

english, 1982

2

Bilayer silicide formation during the interaction of thin chromium, nickel and platinum films with silicon

M.O. Naudé, R. Pretorius, D.J. Marais

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 522 KB

english, 1982

3

Low temperature doping of arsenic atoms in silicon during Pd2Si formation

I. Ohdomari, K. Suguro, M. Akiyama, T. Maeda, K.N. Tu, I. Kimura, K. Yoneda

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 245 KB

english, 1982

4

Contact reaction of silicon and thin films of Ir-V alloys

M. Eizenberg, R. Brener

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 215 KB

english, 1982

5

Auger electron spectroscopy studies of the formation of iridium and rhodium silicides

Y. Shapira, P.A. Tove, L. Stolt, H. Norde

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 258 KB

english, 1982

6

Mechanisms of interdiffusion reactions during the heating of metallic layer contact systems

C.R.M. Grovenor

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 1.75 MB

english, 1982

7

The electronic structure of the GaAs-oxide interface

E.W. Kreutz, P. Schroll

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 61 KB

english, 1982

8

Radioactive 31Si marker studies of metal silicide formation: a computer simulation

R. Pretorius, A.P. Botha

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 47 KB

english, 1982

9

Optical spectroscopy of clean and adsorbate-covered silver and chromium films

P. McBreen, M. Moskovits

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 117 KB

english, 1982

10

Junctions between sputter-deposited CdSe and p-type silicon

J. Koshy, M.P. Ali, P.A. Tove

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 54 KB

english, 1982

11

The interaction of Ni-Pt alloy with silicon

F. Nava, S. Mantovani, G. Pignatel, G. Queirolo, G. Celotti

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 266 KB

english, 1982

12

Aluminum contact to nickel silicide using a thin tungsten barrier

M. Bartur, M.-A. Nicolet

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 33 KB

english, 1982

13

UV photoelectron spectroscopy of thin films and interfaces between 3 and 50 eV and Auger analysis in the same apparatus using multichannel plates and a low energy electron diffraction head

M. Priol, J. Peisner, S. Robin

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 34 KB

english, 1982

14

Investigation of a metal-ionic conductor interface in thin film samples using X-ray photoelectron spectroscopy and electrical measurements

G. Couturier, Y. Danto, A.S. Barrière, Tran Minh Duc, Y. Garaud

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 451 KB

english, 1982

15

Interface characterization of InSb MOS structures

Y. Shapira, J. Bregman, Z. Calahorra, R. Goshen

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 333 KB

english, 1982

16

Characterization of electroless gold films on CdTe crystals

A.M. Mancini, A. Quirini, L. Vasanelli, E. Perillo, E. Rosato, G. Spadaccini

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 240 KB

english, 1982

17

Catalysis on oriented ultrathin films of platinum on Al2O3

H. Glassl, K. Hayek

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 842 KB

english, 1982

18

Interfaces of semiconducting molecular beam epitaxial films

Robert S. Bauer

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 755 KB

english, 1982

19

Electronic states and microstructure at the silicide-silicon interface

P.S. Ho, G.W. Rubloff

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 926 KB

english, 1982

20

Development and confirmation of the unified model for Schottky barrier formation and MOS interface states on III-V compounds

W.E. Spicer, S. Eglash, I. Lindau, C.Y. Su, P.R. Skeath

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 866 KB

english, 1982

21

Interface chemical reaction and diffusion of thin metal films on semiconductors

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 500 KB

english, 1982

22

Author index

Journal:

Thin Solid Films

Year:

1982

File:

PDF, 78 KB

1982

23

Surface photovoltage measurements and Fermi level pinning: comments on “development and confirmation of the unified model for Schottky barrier formation and MOS interface states on III-V compounds”

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 393 KB

english, 1982

24

Reply to “surface photovoltage measurements and Fermi level pinning: comments on ‘development and confirmation of the unified model for Schottky barrier formation and MOS interface states on III-V compounds’”

S. Eglash, W.E. Spicer, I. Lindau

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 368 KB

english, 1982

25

Langmuir-Blodgett films in amorphous silicon MIS structures

J.P. Lloyd, M.C. Petty, G.G. Roberts, P.G. Lecomber, W.E. Spear

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 296 KB

english, 1982