Cross-sectional transmission electron microscopy...

Thin Solid Films 1987 Vol. 154; Iss. 1-2

Cross-sectional transmission electron microscopy characterization of the interface between plasma-sprayed TiC and inconel

G. Veilleux, R.G. Saint-Jacques, S. Dallaire
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Volume:
154
Year:
1987
Language:
english
Pages:
10
DOI:
10.1016/0040-6090(87)90355-5
File:
PDF, 775 KB
english, 1987
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