Volume 154; Issue 1-2

Thin Solid Films

Volume 154; Issue 1-2
1

Editorial Board

Year:
1987
Language:
english
File:
PDF, 44 KB
english, 1987
2

Thin film microanalysis using laser ablation and laser ionization mass spectrometry

Year:
1987
Language:
english
File:
PDF, 601 KB
english, 1987
3

Factor analysis in surface spectroscopies

Year:
1987
Language:
english
File:
PDF, 544 KB
english, 1987
4

Quantification of physical properties of thin films

Year:
1987
Language:
english
File:
PDF, 698 KB
english, 1987
5

Characterization of epitaxial films by grazing-incidence X-ray diffraction

Year:
1987
Language:
english
File:
PDF, 651 KB
english, 1987
7

Phase transformation in plasma-sprayed iron oxide coatings

Year:
1987
Language:
english
File:
PDF, 495 KB
english, 1987
9

Future trends of cross-sectional transmission electron microscopy for electronic and photonic devices

Year:
1987
Language:
english
File:
PDF, 574 KB
english, 1987
12

Films of rare earth oxides formed by electron beam evaporation

Year:
1987
Language:
english
File:
PDF, 497 KB
english, 1987
13

The mechanical properties of thin films: A review

Year:
1987
Language:
english
File:
PDF, 968 KB
english, 1987
17

Intrinsic stress in A1N prepared by dual-ion-beam sputtering

Year:
1987
Language:
english
File:
PDF, 830 KB
english, 1987
19

Adhesion of physically vapor-deposited titanium coatings to beryllium substrates

Year:
1987
Language:
english
File:
PDF, 1.08 MB
english, 1987
20

Ultramicrohardness measurements of coated samples

Year:
1987
Language:
english
File:
PDF, 413 KB
english, 1987
22

Picosecond acoustics as a non-destructive tool for the characterization of very thin films

Year:
1987
Language:
english
File:
PDF, 439 KB
english, 1987
23

Brillouin spectroscopy of multilayer films

Year:
1987
Language:
english
File:
PDF, 763 KB
english, 1987
24

Raman characterization of optical thin film coatings

Year:
1987
Language:
english
File:
PDF, 594 KB
english, 1987
25

Raman microprobe study of silicon- and germanium- on-insulator structures

Year:
1987
Language:
english
File:
PDF, 425 KB
english, 1987
26

Raman enhancement methods for molecular structure characterization of optical thin films

Year:
1987
Language:
english
File:
PDF, 860 KB
english, 1987
29

A comparison of thickness-measuring methods

Year:
1987
Language:
english
File:
PDF, 455 KB
english, 1987
30

Angle-dependent X-ray photoelectron spectroscopy investigation of GaAs surfaces

Year:
1987
Language:
english
File:
PDF, 348 KB
english, 1987
37

Evaluation of adhesion strength of thin hard coatings

Year:
1987
Language:
english
File:
PDF, 796 KB
english, 1987
38

The relationship between hardness and scratch adhession

Year:
1987
Language:
english
File:
PDF, 904 KB
english, 1987
41

Magnetic properties of D.C. magnetron sputtered CoCr thin films

Year:
1987
Language:
english
File:
PDF, 368 KB
english, 1987
42

Analysis of cobalt-doped iron oxide thin films by synchrotron radiation

Year:
1987
Language:
english
File:
PDF, 427 KB
english, 1987
43

The effect of ultrathin selenium overcoat on the stability of tellurium-based optical recording media

Year:
1987
Language:
english
File:
PDF, 752 KB
english, 1987
44

Author index

Year:
1987
Language:
english
File:
PDF, 59 KB
english, 1987