Variable angle spectroscopic ellipsometry: A...

Variable angle spectroscopic ellipsometry: A non-destructive characterization technique for ultrathin and multilayer materials

John A. Woollam, Paul G. Snyder, Martin C. Rost
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Volume:
166
Year:
1988
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(88)90393-8
File:
PDF, 337 KB
english, 1988
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