Capacitance-voltage measurements on a p-type InSb...

Thin Solid Films 1989 Vol. 168; Iss. 2

Capacitance-voltage measurements on a p-type InSb metal/insulator/semiconductor structure with Si3N4 as the insulator

B. Ullrich, F. Kuchar, R. Meisels, F. Olcaytug, A. Jachimowicz
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Volume:
168
Year:
1989
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(89)90001-1
File:
PDF, 280 KB
english, 1989
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