Volume 168; Issue 2

Thin Solid Films

Volume 168; Issue 2
2

Thallium thin film oxidation investigated by an optical absorption method

Year:
1989
Language:
english
File:
PDF, 153 KB
english, 1989
3

Electrical properties of carbon black-polyimide thick films

Year:
1989
Language:
english
File:
PDF, 242 KB
english, 1989
4

Electronic structure of plasma-deposited amorphous Si-C alloy films

Year:
1989
Language:
english
File:
PDF, 418 KB
english, 1989
5

Tailored target approach to the deposition of gradient index optical filters

Year:
1989
Language:
english
File:
PDF, 351 KB
english, 1989
9

Characterization of a plasma-sprayed YBaCuO superconductor

Year:
1989
Language:
english
File:
PDF, 1.04 MB
english, 1989
11

Analysis of the interface of bismuth with polycrystalline selenium thin films

Year:
1989
Language:
english
File:
PDF, 452 KB
english, 1989
16

Thermal degradation of TiSi2/poly-Si gate electrodes

Year:
1989
Language:
english
File:
PDF, 1.59 MB
english, 1989
17

Deposition of stoichiometric MoS2 thin films by pulsed laser evaporation

Year:
1989
Language:
english
File:
PDF, 514 KB
english, 1989
18

The direct photochemical vapour deposition of SiO2 from Si2H6 and N2O3 mixtures

Year:
1989
Language:
english
File:
PDF, 341 KB
english, 1989
19

A microstructural study of oriented polymer-zinc diethyldithiocarbamate thin films

Year:
1989
Language:
english
File:
PDF, 1.91 MB
english, 1989
21

Corrigendum

Year:
1989
Language:
english
File:
PDF, 202 KB
english, 1989
22

Author index

Year:
1989
Language:
english
File:
PDF, 126 KB
english, 1989
23

Contents of vol. 168

Year:
1989
Language:
english
File:
PDF, 162 KB
english, 1989