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Non-destructive characterization of III–V alloy multilayer structures using spectroscopic ellipsometry
C. Pickering, R.T. Carline, N.S. Garawal, J.L. Stehlé, J.P. Piel, R. Blunt, P. KirbyVolume:
233
Year:
1993
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(93)90083-2
File:
PDF, 378 KB
english, 1993