Volume 233; Issue 1-2

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Thin Solid Films
Volume 233; Issue 1-2

Thin Solid Films

Volume 233; Issue 1-2

1

Organization

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 37 KB

english, 1993

2

New developments in spectroellipsometry: the challenge of surfaces

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 827 KB

english, 1993

3

Hydrogen-terminated Si(100) surfaces investigated by reflectance anisotropy spectroscopy

A.B. Müller, F. Reinhardt, U. Resch, W. Richter, K.C. Rose, U. Rossow

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 402 KB

english, 1993

4

Optical anisotropies of Ag single crystals

Y. Borensztein, A. Tadjeddine, W.L. Mochan, J. Tarriba, R.G. Barrera

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 313 KB

english, 1993

5

Ellipsometry in electrochemistry: a spectrum of applications

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 685 KB

english, 1993

6

Spectroscopic ellipsometry of carbon electrodes during electrochemical activation

R. Kötz, C. Barbero, B. Schnyder, O. Haas

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 439 KB

english, 1993

7

Ellipsometry of iron hydrous oxide layers formed by potentiodynamic techniques

J.O. Zerbino, O.L. Bulhoes, S. Juanto, M.I. Miguez, J.R. Vilche, A.J. Arvia

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 204 KB

english, 1993

8

Ellipsometry and electron diffraction study of anodically formed Pd oxide layers

A.E. Bolzán, J.O. Zerbino, E. Macchi, A.J. Arvia

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 476 KB

english, 1993

9

Applications of spectroscopic ellipsometry to microelectronics

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 1.14 MB

english, 1993

10

Modulated ellipsometry for characterization of multiple quantum wells and superlattices

J.-Th. Zettler, H. Mikkelsen, Th. Trepk, K. Leo, H. Kurz, W. Richter

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 452 KB

english, 1993

11

Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon

T. Lohner, M. Fried, J. Gyulai, K. Vedam, N.V. Nguyen, L.J. Hanekamp, A. van Silfhout

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 355 KB

english, 1993

12

Temperature dependence of the dielectric function and interband critical points of AlAs obtained on an MBE grown layer

M. Garriga, M. Kelly, K. Ploog

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 277 KB

english, 1993

13

In-situ dual-wavelength and ex-situ spectroscopic ellipsometry studies of strained SiGe epitaxial layers and multi-quantum well structures

C. Pickering, R.T. Carline, D.J. Robbins, W.Y. Leong, D.E. Gray, R. Greef

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 383 KB

english, 1993

14

Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47 - xAs on InP in the wavelength range from 280 to 1900 nm

H.W. Dinges, H. Burkhard, R. Lösch, H. Nickel, W. Schlapp

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 280 KB

english, 1993

15

Determination of accurate critical-point energies, linewidths and line shapes from spectroscopic ellipsometry data

J.W. Garland, Charles C. Kim, H. Abad, P.M. Raccah

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 397 KB

english, 1993

16

Si- and Ge-like features in the dielectric function of Sin Gem superlattices

J.C. Jans, R.W.J. Hollering, D.J. Gravesteijn, C.W. Fredriksz

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 407 KB

english, 1993

17

Dielectric function of GaAsAlAssuperlattices grown on GaAs substrates with different orientation

F. Lukeš, K. Ploog

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 510 KB

english, 1993

18

Non-destructive characterization of III–V alloy multilayer structures using spectroscopic ellipsometry

C. Pickering, R.T. Carline, N.S. Garawal, J.L. Stehlé, J.P. Piel, R. Blunt, P. Kirby

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 378 KB

english, 1993

19

Thin epitaxial films of wide gap II–VI compounds studied by spectroscopic ellipsometry

U. Rossow, T. Werninghaus, D.R.T. Zahn, W. Richter, K. Horn

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 348 KB

english, 1993

20

Ellipsometric characterization of InP-based quantum well structures

U. Rossow, A. Krost, T. Werninghaus, K. Schatke, W. Richter, A. Hase, H. Künzel, H. Roehle

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 452 KB

english, 1993

21

Temperature dependence of the dielectric function and the interband critical-point parameters of GaP

Stefan Zollner, Miquel Garriga, Jens Kircher, Josef Humlíček, Manuel Cardona, Georg Neuhold

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 311 KB

english, 1993

22

Detection and characterization of transient surface periodic structures formed during pulsed-laser annealing of semiconductor surfaces by ellipsometry

D.J. Brink, J.E. Smit

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 403 KB

english, 1993

23

Non-destructive depth profiling of silicon ion implantation induced damage in silicon (100) substrates

S. Lynch, M. Murtagh, G.M. Crean, P.V. Kelly, M. O'Connor, C. Jeynes

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 346 KB

english, 1993

24

An ellipsometric investigation of ion implanted silicon

Gabriela Popescu, Ioan Boca

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 214 KB

english, 1993

25

Spectroellipsometry characterization of directly bonded silicon-on-insulator structures

M.E. El-Ghazzawi, T. Saitoh, N. Hori, A. Sakai, T. Oka

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 374 KB

english, 1993

26

Ellipsometric characterization of hydrogen-rich oxynitride films

A. Borghesi, A. Sassella, S. Rojas

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 314 KB

english, 1993

27

Investigation of the system InSbSiO2 by spectroscopic multiangle ellipsometry

S. Russev, E. Valcheva, K. Germanova

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 371 KB

english, 1993

28

Characterization of SiO2GaAs interface structures using spectroscopic ellipsometry

Y. Watanabe, T. Saitoh, M. Miyazaki, K. Suzuki

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 341 KB

english, 1993

29

The influence of temperature and pressure on the structure of remote plasma enhanced chemically vapor deposited SiO2 investigated by spectroscopic ellipsometry

B. Gruska, K. Wandel

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 359 KB

english, 1993

30

Real time spectroscopic ellipsometry for characterization of nucleation, growth, and optical functions of thin films

R.W. Collins, Ilsin An, H.V. Nguyen, Yiwei Lu

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 825 KB

english, 1993

31

Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry

Suraiya Nafis, Natale J. Ianno, Paul G. Snyder, William A. McGahan, Blaine Johs, John A. Woollam

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 238 KB

english, 1993

32

Spectroellipsometric study of the growth and phase transitions of a two-dimensional metal: Pb on Ge(111)

M. Abraham, G. LeLay

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 278 KB

english, 1993

33

In situ ellipsometry of soft x-ray multilayer fabrication

Masaki Yamamoto, Akira Arai

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 374 KB

english, 1993

34

Analysis of critical points in semiconductor optical functions from in situ and real-time spectroscopic ellipsometry

Hien V. Nguyen, R.W. Collins

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 373 KB

english, 1993

35

Hydrogen diffusion and reaction processes in thin films investigated by real time spectroscopic ellipsometry

Ilsin An, R.W. Collins, Hien V. Nguyen, K. Vedam, H.S. Witham, R. Messier

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 432 KB

english, 1993

36

Study by real time ellipsometry of the growth of amorphous and microcrystalline silicon thin films combining glow discharge decomposition and UV light irradiation

N. Layadi, P. Roca i Cabarrocas, V. Yakovlev, B. Drévillon

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 414 KB

english, 1993

37

Ellipsometry study of non-uniform lateral growth of ZnO thin films

Shakil Pittal, Paul G. Snyder, N.J. Ianno

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 242 KB

english, 1993

38

Real-time monitoring and control during MOVPE growth of CdTe using multiwavelength ellipsometry

Blaine Johs, Dave Doerr, Shakil Pittal, I.B. Bhat, S. Dakshinamurthy

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 332 KB

english, 1993

39

Editorial Board

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 40 KB

english, 1993

40

Preface

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 88 KB

english, 1993

41

Reflectance anisotropy spectroscopy: a new method for semiconductor surface chemistry investigation

V.L. Berkovits, D. Paget

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 403 KB

english, 1993

42

Optical anisotropy of Ge(001)

H. Wormeester, D.J. Wentink, P.L. de Boeij, A. van Silfhout

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 391 KB

english, 1993

43

Full microscopic treatment of the optical response of the Si(100) 2 × 1 surface

C.M.J. Wijers, G.P.M. Poppe, P.L. de Boeij, H.G. Bekker, D.J. Wentink

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 358 KB

english, 1993

44

The surface roughness and optical properties of high quality Si epitaxial layers

V. Nayar, C. Pickering, A.J. Pidduck, R.T. Carline, W.Y. Leong, D.J. Robbins

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 828 KB

english, 1993

45

Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe

Glennis J. Orloff, John A. Woollam, Ping He, William A. McGahan, J.R. McNeil, R.D. Jacobson, Blaine Johs

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 470 KB

english, 1993

46

Estimation of the quality of polished optical glass surfaces by spectral ellipsometry

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 201 KB

english, 1993

47

Experimental roughness excitation of surface electromagnetic waves and their detection by ellipsometry

M. Gauch, G. Quentel

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 472 KB

english, 1993

48

Characterization of different conversion coatings on aluminium with spectroscopic ellipsometry

J. De Laet, J. Vanhellemont, H. Terryn, J. Vereecken

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 448 KB

english, 1993

49

Anodic oxidation of aluminium in sulphuric acid monitored by ex-situ and in-situ spectroscopic ellipsometry

R. Kötz, B. Schnyder, C. Barbero

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 610 KB

english, 1993

50

Ellipsometric study of hydrous gold oxide layers and gold surfaces resulting from their electroreduction

M.E. Vela, J.O. Zerbino, A.J. Arvia

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 281 KB

english, 1993

51

Effect of anisotropy on microellipsometry in the TiTiO2 system

A. Michaelis, J.W. Schultze

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 424 KB

english, 1993

52

Optical spectra of a conducting polymer (polymethyl-3-thiophene) at several stages of the electrodeposition process

C. Tian, G. Jin, F. Chao, M. Costa, J.P. Roger

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 703 KB

english, 1993

53

Determination of porous silicon film parameters by polarized light reflectance measurements

P. Basmaji, V.S. Bagnato, V. Grivickas, G.I. Surdutovich, R. Vitlina

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 371 KB

english, 1993

54

Circular birefringence in zinc-blende-type semiconductors

P. Etchegoin, M. Cardona

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 336 KB

english, 1993

55

Piezo-optical response of semiconductors

P. Etchegoin, J. Kircher, M. Cardona

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 329 KB

english, 1993

56

Spectroscopic ellipsometry of strained Si1-x Gex layers

M. Líbezný, J. Poortmans, M. Caymax, A. Van Ammel, J. Kuběna, V. Holý, J. Vanhellemont

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 351 KB

english, 1993

57

Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry

G. Vuye, S. Fisson, V. Nguyen Van, Y. Wang, J. Rivory, F. Abelès

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 461 KB

english, 1993

58

Spectroscopic transmission ellipsometry studies of intersub-band transitions in n−GaAsAl0.3Ga0.7As quantum wells

K.B. Ozanyan, O. Hunderi

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 358 KB

english, 1993

59

Spectroscopic ellipsometry study of the relaxation state of amorphous silicon

R. Reitano, M.G. Grimaldi, P. Baeri, A. Borghesi, A. Sassella

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 351 KB

english, 1993

60

Optimization of the polycrystalline silicon-on-silicon dioxide characterization using spectroscopic ellipsometry

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 323 KB

english, 1993

61

Characterization of silicon on insulator multilayers using ex situ spectroscopic ellipsometry and in situ monochromatic ellipsometry during plasma etching

R. Greef, D.E. Gray, N.J. Dartnell, J. Zhu, S. Lynch, G.M. Crean

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 337 KB

english, 1993

62

Study of thin films of transparent electronic materials by phase-modulated spectroellipsometry

J. Campmany, A. Canillas, J.L. Andújar, J. Costa, E. Bertran

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 337 KB

english, 1993

63

Ellipsometry study of the adhesion of dielectric thin films on polymer substrates

S. Vallon, B. Drévillon, J.C. Rostaing

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 312 KB

english, 1993

64

Study of CaF2 growth on Si, a-Si O2 by in-situ spectroscopic ellipsometry

J. Rivory, S. Fisson, V. Nguyen Van, G. Vuye, Y. Wang, F. Abelés, K. Yu-Zhang

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 464 KB

english, 1993

65

In situ ellipsometric study of the influence of powder formation on the initial growth of glow discharge a−Si:H

U.I. Schmidt, B. Schröder, H. Oechsner

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 312 KB

english, 1993

66

The fastest real time spectroscopic ellipsometry: applications and limitations for in situ and quality control

J.-P. Piel, J.-L. Stehle, O. Thomas

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 408 KB

english, 1993

67

Ellipsometric studies on the oxidation of thin copper films

M. Rauh, P. Wiβmann, M. Wölfel

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 296 KB

english, 1993