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Volume 233; Issue 1-2
Main
Thin Solid Films
Volume 233; Issue 1-2
Thin Solid Films
Volume 233; Issue 1-2
1
Organization
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 37 KB
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english, 1993
2
New developments in spectroellipsometry: the challenge of surfaces
D.E. Aspnes
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 827 KB
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english, 1993
3
Hydrogen-terminated Si(100) surfaces investigated by reflectance anisotropy spectroscopy
A.B. Müller
,
F. Reinhardt
,
U. Resch
,
W. Richter
,
K.C. Rose
,
U. Rossow
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 402 KB
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english, 1993
4
Optical anisotropies of Ag single crystals
Y. Borensztein
,
A. Tadjeddine
,
W.L. Mochan
,
J. Tarriba
,
R.G. Barrera
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 313 KB
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english, 1993
5
Ellipsometry in electrochemistry: a spectrum of applications
R. Greef
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 685 KB
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english, 1993
6
Spectroscopic ellipsometry of carbon electrodes during electrochemical activation
R. Kötz
,
C. Barbero
,
B. Schnyder
,
O. Haas
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 439 KB
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english, 1993
7
Ellipsometry of iron hydrous oxide layers formed by potentiodynamic techniques
J.O. Zerbino
,
O.L. Bulhoes
,
S. Juanto
,
M.I. Miguez
,
J.R. Vilche
,
A.J. Arvia
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 204 KB
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english, 1993
8
Ellipsometry and electron diffraction study of anodically formed Pd oxide layers
A.E. Bolzán
,
J.O. Zerbino
,
E. Macchi
,
A.J. Arvia
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 476 KB
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english, 1993
9
Applications of spectroscopic ellipsometry to microelectronics
E.A. Irene
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 1.14 MB
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english, 1993
10
Modulated ellipsometry for characterization of multiple quantum wells and superlattices
J.-Th. Zettler
,
H. Mikkelsen
,
Th. Trepk
,
K. Leo
,
H. Kurz
,
W. Richter
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 452 KB
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english, 1993
11
Ion-implantation-caused special damage profiles determined by spectroscopic ellipsometry in crystalline and in relaxed (annealed) amorphous silicon
T. Lohner
,
M. Fried
,
J. Gyulai
,
K. Vedam
,
N.V. Nguyen
,
L.J. Hanekamp
,
A. van Silfhout
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 355 KB
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english, 1993
12
Temperature dependence of the dielectric function and interband critical points of AlAs obtained on an MBE grown layer
M. Garriga
,
M. Kelly
,
K. Ploog
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 277 KB
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english, 1993
13
In-situ dual-wavelength and ex-situ spectroscopic ellipsometry studies of strained SiGe epitaxial layers and multi-quantum well structures
C. Pickering
,
R.T. Carline
,
D.J. Robbins
,
W.Y. Leong
,
D.E. Gray
,
R. Greef
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 383 KB
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english, 1993
14
Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In0.52Al0.48As and In0.53AlxGa0.47 - xAs on InP in the wavelength range from 280 to 1900 nm
H.W. Dinges
,
H. Burkhard
,
R. Lösch
,
H. Nickel
,
W. Schlapp
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 280 KB
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english, 1993
15
Determination of accurate critical-point energies, linewidths and line shapes from spectroscopic ellipsometry data
J.W. Garland
,
Charles C. Kim
,
H. Abad
,
P.M. Raccah
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 397 KB
Your tags:
english, 1993
16
Si- and Ge-like features in the dielectric function of Sin Gem superlattices
J.C. Jans
,
R.W.J. Hollering
,
D.J. Gravesteijn
,
C.W. Fredriksz
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 407 KB
Your tags:
english, 1993
17
Dielectric function of GaAsAlAssuperlattices grown on GaAs substrates with different orientation
F. Lukeš
,
K. Ploog
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 510 KB
Your tags:
english, 1993
18
Non-destructive characterization of III–V alloy multilayer structures using spectroscopic ellipsometry
C. Pickering
,
R.T. Carline
,
N.S. Garawal
,
J.L. Stehlé
,
J.P. Piel
,
R. Blunt
,
P. Kirby
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 378 KB
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english, 1993
19
Thin epitaxial films of wide gap II–VI compounds studied by spectroscopic ellipsometry
U. Rossow
,
T. Werninghaus
,
D.R.T. Zahn
,
W. Richter
,
K. Horn
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 348 KB
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english, 1993
20
Ellipsometric characterization of InP-based quantum well structures
U. Rossow
,
A. Krost
,
T. Werninghaus
,
K. Schatke
,
W. Richter
,
A. Hase
,
H. Künzel
,
H. Roehle
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 452 KB
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english, 1993
21
Temperature dependence of the dielectric function and the interband critical-point parameters of GaP
Stefan Zollner
,
Miquel Garriga
,
Jens Kircher
,
Josef Humlíček
,
Manuel Cardona
,
Georg Neuhold
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 311 KB
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english, 1993
22
Detection and characterization of transient surface periodic structures formed during pulsed-laser annealing of semiconductor surfaces by ellipsometry
D.J. Brink
,
J.E. Smit
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 403 KB
Your tags:
english, 1993
23
Non-destructive depth profiling of silicon ion implantation induced damage in silicon (100) substrates
S. Lynch
,
M. Murtagh
,
G.M. Crean
,
P.V. Kelly
,
M. O'Connor
,
C. Jeynes
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 346 KB
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english, 1993
24
An ellipsometric investigation of ion implanted silicon
Gabriela Popescu
,
Ioan Boca
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 214 KB
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english, 1993
25
Spectroellipsometry characterization of directly bonded silicon-on-insulator structures
M.E. El-Ghazzawi
,
T. Saitoh
,
N. Hori
,
A. Sakai
,
T. Oka
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 374 KB
Your tags:
english, 1993
26
Ellipsometric characterization of hydrogen-rich oxynitride films
A. Borghesi
,
A. Sassella
,
S. Rojas
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 314 KB
Your tags:
english, 1993
27
Investigation of the system InSbSiO2 by spectroscopic multiangle ellipsometry
S. Russev
,
E. Valcheva
,
K. Germanova
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 371 KB
Your tags:
english, 1993
28
Characterization of SiO2GaAs interface structures using spectroscopic ellipsometry
Y. Watanabe
,
T. Saitoh
,
M. Miyazaki
,
K. Suzuki
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 341 KB
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english, 1993
29
The influence of temperature and pressure on the structure of remote plasma enhanced chemically vapor deposited SiO2 investigated by spectroscopic ellipsometry
B. Gruska
,
K. Wandel
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 359 KB
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english, 1993
30
Real time spectroscopic ellipsometry for characterization of nucleation, growth, and optical functions of thin films
R.W. Collins
,
Ilsin An
,
H.V. Nguyen
,
Yiwei Lu
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 825 KB
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english, 1993
31
Electron cyclotron resonance etching of semiconductor structures studied by in-situ spectroscopic ellipsometry
Suraiya Nafis
,
Natale J. Ianno
,
Paul G. Snyder
,
William A. McGahan
,
Blaine Johs
,
John A. Woollam
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 238 KB
Your tags:
english, 1993
32
Spectroellipsometric study of the growth and phase transitions of a two-dimensional metal: Pb on Ge(111)
M. Abraham
,
G. LeLay
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 278 KB
Your tags:
english, 1993
33
In situ ellipsometry of soft x-ray multilayer fabrication
Masaki Yamamoto
,
Akira Arai
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 374 KB
Your tags:
english, 1993
34
Analysis of critical points in semiconductor optical functions from in situ and real-time spectroscopic ellipsometry
Hien V. Nguyen
,
R.W. Collins
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 373 KB
Your tags:
english, 1993
35
Hydrogen diffusion and reaction processes in thin films investigated by real time spectroscopic ellipsometry
Ilsin An
,
R.W. Collins
,
Hien V. Nguyen
,
K. Vedam
,
H.S. Witham
,
R. Messier
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 432 KB
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english, 1993
36
Study by real time ellipsometry of the growth of amorphous and microcrystalline silicon thin films combining glow discharge decomposition and UV light irradiation
N. Layadi
,
P. Roca i Cabarrocas
,
V. Yakovlev
,
B. Drévillon
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 414 KB
Your tags:
english, 1993
37
Ellipsometry study of non-uniform lateral growth of ZnO thin films
Shakil Pittal
,
Paul G. Snyder
,
N.J. Ianno
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 242 KB
Your tags:
english, 1993
38
Real-time monitoring and control during MOVPE growth of CdTe using multiwavelength ellipsometry
Blaine Johs
,
Dave Doerr
,
Shakil Pittal
,
I.B. Bhat
,
S. Dakshinamurthy
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 332 KB
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english, 1993
39
Editorial Board
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 40 KB
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english, 1993
40
Preface
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 88 KB
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english, 1993
41
Reflectance anisotropy spectroscopy: a new method for semiconductor surface chemistry investigation
V.L. Berkovits
,
D. Paget
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 403 KB
Your tags:
english, 1993
42
Optical anisotropy of Ge(001)
H. Wormeester
,
D.J. Wentink
,
P.L. de Boeij
,
A. van Silfhout
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 391 KB
Your tags:
english, 1993
43
Full microscopic treatment of the optical response of the Si(100) 2 × 1 surface
C.M.J. Wijers
,
G.P.M. Poppe
,
P.L. de Boeij
,
H.G. Bekker
,
D.J. Wentink
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 358 KB
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english, 1993
44
The surface roughness and optical properties of high quality Si epitaxial layers
V. Nayar
,
C. Pickering
,
A.J. Pidduck
,
R.T. Carline
,
W.Y. Leong
,
D.J. Robbins
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 828 KB
Your tags:
english, 1993
45
Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe
Glennis J. Orloff
,
John A. Woollam
,
Ping He
,
William A. McGahan
,
J.R. McNeil
,
R.D. Jacobson
,
Blaine Johs
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 470 KB
Your tags:
english, 1993
46
Estimation of the quality of polished optical glass surfaces by spectral ellipsometry
Jiří Hrdina
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 201 KB
Your tags:
english, 1993
47
Experimental roughness excitation of surface electromagnetic waves and their detection by ellipsometry
M. Gauch
,
G. Quentel
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 472 KB
Your tags:
english, 1993
48
Characterization of different conversion coatings on aluminium with spectroscopic ellipsometry
J. De Laet
,
J. Vanhellemont
,
H. Terryn
,
J. Vereecken
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 448 KB
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english, 1993
49
Anodic oxidation of aluminium in sulphuric acid monitored by ex-situ and in-situ spectroscopic ellipsometry
R. Kötz
,
B. Schnyder
,
C. Barbero
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 610 KB
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english, 1993
50
Ellipsometric study of hydrous gold oxide layers and gold surfaces resulting from their electroreduction
M.E. Vela
,
J.O. Zerbino
,
A.J. Arvia
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 281 KB
Your tags:
english, 1993
51
Effect of anisotropy on microellipsometry in the TiTiO2 system
A. Michaelis
,
J.W. Schultze
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 424 KB
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english, 1993
52
Optical spectra of a conducting polymer (polymethyl-3-thiophene) at several stages of the electrodeposition process
C. Tian
,
G. Jin
,
F. Chao
,
M. Costa
,
J.P. Roger
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 703 KB
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english, 1993
53
Determination of porous silicon film parameters by polarized light reflectance measurements
P. Basmaji
,
V.S. Bagnato
,
V. Grivickas
,
G.I. Surdutovich
,
R. Vitlina
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 371 KB
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english, 1993
54
Circular birefringence in zinc-blende-type semiconductors
P. Etchegoin
,
M. Cardona
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 336 KB
Your tags:
english, 1993
55
Piezo-optical response of semiconductors
P. Etchegoin
,
J. Kircher
,
M. Cardona
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 329 KB
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english, 1993
56
Spectroscopic ellipsometry of strained Si1-x Gex layers
M. Líbezný
,
J. Poortmans
,
M. Caymax
,
A. Van Ammel
,
J. Kuběna
,
V. Holý
,
J. Vanhellemont
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 351 KB
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english, 1993
57
Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry
G. Vuye
,
S. Fisson
,
V. Nguyen Van
,
Y. Wang
,
J. Rivory
,
F. Abelès
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 461 KB
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english, 1993
58
Spectroscopic transmission ellipsometry studies of intersub-band transitions in n−GaAsAl0.3Ga0.7As quantum wells
K.B. Ozanyan
,
O. Hunderi
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 358 KB
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english, 1993
59
Spectroscopic ellipsometry study of the relaxation state of amorphous silicon
R. Reitano
,
M.G. Grimaldi
,
P. Baeri
,
A. Borghesi
,
A. Sassella
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 351 KB
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english, 1993
60
Optimization of the polycrystalline silicon-on-silicon dioxide characterization using spectroscopic ellipsometry
L.M. Asinovsky
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 323 KB
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english, 1993
61
Characterization of silicon on insulator multilayers using ex situ spectroscopic ellipsometry and in situ monochromatic ellipsometry during plasma etching
R. Greef
,
D.E. Gray
,
N.J. Dartnell
,
J. Zhu
,
S. Lynch
,
G.M. Crean
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 337 KB
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english, 1993
62
Study of thin films of transparent electronic materials by phase-modulated spectroellipsometry
J. Campmany
,
A. Canillas
,
J.L. Andújar
,
J. Costa
,
E. Bertran
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 337 KB
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english, 1993
63
Ellipsometry study of the adhesion of dielectric thin films on polymer substrates
S. Vallon
,
B. Drévillon
,
J.C. Rostaing
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 312 KB
Your tags:
english, 1993
64
Study of CaF2 growth on Si, a-Si O2 by in-situ spectroscopic ellipsometry
J. Rivory
,
S. Fisson
,
V. Nguyen Van
,
G. Vuye
,
Y. Wang
,
F. Abelés
,
K. Yu-Zhang
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 464 KB
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english, 1993
65
In situ ellipsometric study of the influence of powder formation on the initial growth of glow discharge a−Si:H
U.I. Schmidt
,
B. Schröder
,
H. Oechsner
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 312 KB
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english, 1993
66
The fastest real time spectroscopic ellipsometry: applications and limitations for in situ and quality control
J.-P. Piel
,
J.-L. Stehle
,
O. Thomas
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 408 KB
Your tags:
english, 1993
67
Ellipsometric studies on the oxidation of thin copper films
M. Rauh
,
P. Wiβmann
,
M. Wölfel
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 296 KB
Your tags:
english, 1993
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