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Real time spectroscopic ellipsometry for characterization...

Real time spectroscopic ellipsometry for characterization of nucleation, growth, and optical functions of thin films

R.W. Collins, Ilsin An, H.V. Nguyen, Yiwei Lu
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Volume:
233
Year:
1993
Language:
english
Pages:
9
DOI:
10.1016/0040-6090(93)90100-4
File:
PDF, 825 KB
english, 1993
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