Real-time monitoring and control during MOVPE growth of CdTe using multiwavelength ellipsometry
Blaine Johs, Dave Doerr, Shakil Pittal, I.B. Bhat, S. DakshinamurthyVolume:
233
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(93)90111-2
File:
PDF, 332 KB
english, 1993