In situ diagnosis of a-Si:H—metal interface reactions using...

In situ diagnosis of a-Si:H—metal interface reactions using IR spectroscopic reflectometry

Yasutake Toyoshima
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Volume:
234
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(93)90287-y
File:
PDF, 360 KB
english, 1993
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