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Volume 234; Issue 1-2
Main
Thin Solid Films
Volume 234; Issue 1-2
Thin Solid Films
Volume 234; Issue 1-2
1
An IR phase-modulated ellipsometer using a Fourier transform spectrometer for in situ applications
A. Canillas
,
E. Pascual
,
B. Drévillon
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 401 KB
Your tags:
english, 1993
2
Spectroscopic IR ellipsometry with imperfect components
J.H.W.G. den Boer
,
G.M.W. Kroesen
,
M. Haverlag
,
F.J. de Hoog
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 329 KB
Your tags:
english, 1993
3
IR ellipsometry of the highly anisotropic materials αSiO2 and αAl2O3
J. Humlíček
,
A. Röseler
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 333 KB
Your tags:
english, 1993
4
IR ellipsometry investigations of N2O-nitrided silicon oxide thin films on silicon
M. Weidner
,
A. Röseler
,
M. Eichler
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 310 KB
Your tags:
english, 1993
5
Spectroscopic IR ellipsometry of [100] and [001] oriented YBa2Cu3O7−δ films
E. Wold
,
J. Bremer
,
O. Hunderi
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 404 KB
Your tags:
english, 1993
6
IR spectroscopic ellipsometry: instrumentation and applications in semiconductors
Gilbert Zalczer
,
Olivier Thomas
,
Jean-Philippe Piel
,
Jean-Louis Stehlé
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 418 KB
Your tags:
english, 1993
7
In situ investigation by IR ellipsometry of the growth and interfaces of amorphous silicon and related materials
R. Ossikovski
,
H. Shirai
,
B. Drévillon
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 373 KB
Your tags:
english, 1993
8
In situ diagnosis of a-Si:H—metal interface reactions using IR spectroscopic reflectometry
Yasutake Toyoshima
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 360 KB
Your tags:
english, 1993
9
Multichannel polarization state detectors for time-resolved ellipsometry
R.M.A. Azzam
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 315 KB
Your tags:
english, 1993
10
Spectroscopic ellipsometry under external excitation
G. Jin
,
H. El Rhaleb
,
J.P. Roger
,
A.C. Boccara
,
J.L. Stehlé
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 403 KB
Your tags:
english, 1993
11
Improved rotating analyser-polarizer type of scanning ellipsometer
Liang-Yao Chen
,
Xing-Wei Feng
,
Yi Su
,
Hong-Zhou Ma
,
You-Hua Qian
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 327 KB
Your tags:
english, 1993
12
A novel method for stabilizing the photoelastic modulator used in a polarization modulated spectroscopic ellipsometer
Tomoyuki Fukazawa
,
Mitsuru Sano
,
Yu Yoshida
,
Nobuyuki Sakayanagi
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 384 KB
Your tags:
english, 1993
13
Regression calibration method for rotating element ellipsometers
Blaine Johs
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 293 KB
Your tags:
english, 1993
14
Photoellipsometry: a modulation spectroscopy method applied to n-type GaAs
Yi-Ming Xiong
,
Paul G. Snyder
,
John A. Woollam
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 225 KB
Your tags:
english, 1993
15
High precision UV-visible-near-IR Stokes vector spectroscopy
J.-Th. Zettler
,
Th. Trepk
,
L. Spanos
,
Y.-Z. Hu
,
W. Richter
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 452 KB
Your tags:
english, 1993
16
A new and high precision achromatic ellipsometer: a two-channel and polarization rotator method
J. Monin
,
H. Sahsah
,
O. Brevet-Philibert
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 323 KB
Your tags:
english, 1993
17
Data analysis for spectroscopic ellipsometry
G.E. Jellison Jr.
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 684 KB
Your tags:
english, 1993
18
Numerical aspects of the implementation of effective-medium approximation models in spectroscopic ellipsometry regression software
Ph.J. Rouseel
,
J. Vanhellemont
,
H.E. Maes
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 347 KB
Your tags:
english, 1993
19
Ellipsometry and reflectance of inhomogeneous and anisotropic media: a new computationally efficient approach
E. Toussaere
,
J. Zyss
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 552 KB
Your tags:
english, 1993
20
Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films
William A. McGahan
,
Blaine Johs
,
John A. Woollam
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 307 KB
Your tags:
english, 1993
21
Variable angle spectroscopic ellipsometry: application to poled polymers for non-linear optics
E. Toussaere
,
J. Zyss
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 359 KB
Your tags:
english, 1993
22
Modelling of ellipsometric data of inhomogeneous TiO2 films
G. Parjadis de Lariviére
,
J.M. Frigerio
,
F. Bridou
,
J. Rivory
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 347 KB
Your tags:
english, 1993
23
Optical properties of plasma polymer films (hexamethyldisiloxane)
R. Rochotzki
,
M. Arzt
,
F. Blaschta
,
E. Kreyβig
,
H.U. Poll
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 422 KB
Your tags:
english, 1993
24
An ellipsometric study of layered droplets
M.P. Valignat
,
N. Fraysse
,
A.M. Cazabat
,
F. Heslot
,
P. Levinson
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 252 KB
Your tags:
english, 1993
25
Interfacial behaviour of non-ionic surfactants at the silica-water interface revealed by ellipsometry
F. Tiberg
,
B. Lindman
,
M. Landgren
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 400 KB
Your tags:
english, 1993
26
An ellipsometric study of adsorption isotherms
P. Levinson
,
M.P. Valignat
,
N. Fraysse
,
A.M. Cazabat
,
F. Heslot
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 305 KB
Your tags:
english, 1993
27
IR spectroscopic ellipsometry: transmission studies on liquid crystals
J. Reins
,
E.H. Korte
,
A. Röseler
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 383 KB
Your tags:
english, 1993
28
Ellipsometric study of specular reflection from a naturally optically active medium
M.P. Silverman
,
J. Badoz
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 374 KB
Your tags:
english, 1993
29
Characterization of radiative surface modes and anisotropy in Ag/SiO2 multilayers, by visible and IR ellipsometry
A. Bichri
,
O. Hunderi
,
J. Lafait
,
E. Wold
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 349 KB
Your tags:
english, 1993
30
Spectroscopic variations of optical constant and emissivity of PtAl2O3 cermet thin films
J.P. Segaud
,
B. Drévillon
,
E. Pascual
,
R. Ossikovski
,
G. Monnier
,
L. Rimbourg
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 335 KB
Your tags:
english, 1993
31
Surface characterization of metal plates exposed to atomic oxygen in space
J.S. Brodkin
,
L.C. Sengupta
,
W. Franzen
,
P.L. Sagalyn
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 723 KB
Your tags:
english, 1993
32
Mid- and near-IR ellipsometry of Y1−xPrxBa2Cu3O7 epitaxial films
J. Humlíček
,
K. Kamarás
,
J. Kircher
,
H.-U. Habermeier
,
M. Cardona
,
A. Röseler
,
J.-L. Stehlé
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 305 KB
Your tags:
english, 1993
33
Spectroellipsometric study of phase transitions in d and f metals in ultrahigh vacuum
M.M. Kirillova
,
Yu.V. Knyazev
,
Yu.I. Kuzmin
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 319 KB
Your tags:
english, 1993
34
Optical study of the doping effect of oxygen in YBa2Cu3Oy and Bi2Sr2CaCu2O8+δ single crystals
L.V. Nomerovannaya
,
A.A. Makhnev
,
M.M. Kirillova
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 364 KB
Your tags:
english, 1993
35
Spectroscopic ellipsometric and magneto-optical study of Cu/Fe multilayers
Yu.V. Kudryavtsev
,
O.Yu. Bzhestowski
,
L. Smardz
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 173 KB
Your tags:
english, 1993
36
Optical studies of CuNi, PdNi and CoPt multilayers by conventional and synchrotron radiation ellipsometry
S. Logothetidis
,
J. Petalas
,
N.K. Flevaris
,
R.L. Johnson
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 396 KB
Your tags:
english, 1993
37
Ellipsometric spectroscopy of valence states in amorphous metallic alloys
M.U. Belyi
,
L.V. Poperenko
,
I.A. Schaikevich
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 251 KB
Your tags:
english, 1993
38
Spectroscopic ellipsometry on 1T-TiSe2
T. Buslaps
,
R.L. Johnson
,
G. Jungk
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 268 KB
Your tags:
english, 1993
39
Spectroellipsometric characterization of lanthanide-doped TiO2 films obtained via the sol-gel technique
M. Gartner
,
C. Parlog
,
P. Osiceanu
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 361 KB
Your tags:
english, 1993
40
Investigation of ferrite surface treatments by spectroscopic ellipsometry
M. Dancygier
,
L. Benitah
,
J.-M. Frigerio
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 402 KB
Your tags:
english, 1993
41
Author index of volumes 233 and 234
Journal:
Thin Solid Films
Year:
1993
File:
PDF, 117 KB
Your tags:
1993
42
Subject index of volume 233 and 234
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 758 KB
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english, 1993
43
Editorial Board
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 54 KB
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english, 1993
44
IR spectroscopic ellipsometry: instrumentation and results
A. Röseler
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 604 KB
Your tags:
english, 1993
45
Far-IR spectroscopic ellipsometer
K.-L. Barth
,
D. Böhme
,
K. Kamaräs
,
F. Keilmann
,
M. Cardona
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 297 KB
Your tags:
english, 1993
46
Determination of the refractive index of metal/ceramic composites and their components by spectroscopic ellipsometry and effective medium theories
A. Gombert
,
W. Graf
,
A. Heinzel
,
R. Joerger
,
M. Köhl
,
U. Weimar
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 444 KB
Your tags:
english, 1993
47
Extension of spectroscopic ellipsometry to the far infrared
G. Dittmar
,
V. Offermann
,
M. Pohlen
,
P. Grosse
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 501 KB
Your tags:
english, 1993
48
Broadband spectroscopic ellipsometry based on a Fourier transform spectrometer
A. Gombert
,
M. Köhl
,
U. Weimar
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 341 KB
Your tags:
english, 1993
49
Peculiarities of non-linear spectroscopic ellipsometry of initially isotropic substances
Igor I. Gancheryonok
,
Seishiro Saikan
,
Takashi Kushida
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 365 KB
Your tags:
english, 1993
50
Spectroscopic ellipsometry: a new tool for “on line” quality control
D. Zahorski
,
J.L. Mariani
,
L. Escadafals
,
J. Gilles
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 433 KB
Your tags:
english, 1993
51
Possibilities and limitations of ellipsometry
G. Jungk
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 300 KB
Your tags:
english, 1993
52
Studies on inhomogeneous transparent optical coatings on transparent substrates by spectroscopic ellipsometry
P. Chindaudom
,
K. Vedam
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 285 KB
Your tags:
english, 1993
53
Determination of the sign of δ in spectroscopic ellipsometry without a quarter-wave plate: calculation and applications
J.P. Piel
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 218 KB
Your tags:
english, 1993
54
Spectroscopic ellipsometry characterization of the index profile in inhomogeneous thin films
J.P. Piel
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 202 KB
Your tags:
english, 1993
55
Ellipsometric spectra and fractional derivative spectrum analysis of polyaniline films
D. Mo
,
Y.Y. Lin
,
J.H. Tan
,
Z.X. Yu
,
G.Z. Zhou
,
K.C. Gong
,
G.P. Zhang
,
X.-F. He
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 233 KB
Your tags:
english, 1993
56
Ellipsometry and reflectivity at the Brewster angle: tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces
S. Hénon
,
J. Meunier
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 831 KB
Your tags:
english, 1993
57
Ellipsometry of ultrathin Mo and Si films
P. Široký
,
J. Sobota
,
J. Seidl
,
L. Jastrabík
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 256 KB
Your tags:
english, 1993
58
Relationship between microstructure and optical properties in high Tc superconductors
G.-J. Babonas
,
R. Dagys
,
V. Kregžd≐
,
G. Pukinskas
,
E. Belokoneva
,
L. Leonyuk
,
A. Vetkin
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 286 KB
Your tags:
english, 1993
59
Optical properties of the YBa cuprates: mainly a band structure point of view
J. Kircher
,
Sudha Gopalan
,
M. Cardona
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 425 KB
Your tags:
english, 1993
60
Specular optical activity in α-HgS
A.R. Bungay
,
Yu.P. Svirko
,
N.I. Zheludev
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 291 KB
Your tags:
english, 1993
61
Invisible layers in ellipsometry
E.G. Bortchagovsky
,
O.M. Getsko
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 309 KB
Your tags:
english, 1993
62
Analysis of the oxidation of polycrystalline zinc selenide by spectroscopic ellipsometry and photothermal deflection spectroscopy
E. Masetti
,
M. Montecchi
,
M.P. da Silva
Journal:
Thin Solid Films
Year:
1993
Language:
english
File:
PDF, 294 KB
Your tags:
english, 1993
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