Volume 234; Issue 1-2

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Thin Solid Films
Volume 234; Issue 1-2

Thin Solid Films

Volume 234; Issue 1-2

1

An IR phase-modulated ellipsometer using a Fourier transform spectrometer for in situ applications

A. Canillas, E. Pascual, B. Drévillon

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 401 KB

english, 1993

2

Spectroscopic IR ellipsometry with imperfect components

J.H.W.G. den Boer, G.M.W. Kroesen, M. Haverlag, F.J. de Hoog

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 329 KB

english, 1993

3

IR ellipsometry of the highly anisotropic materials αSiO2 and αAl2O3

J. Humlíček, A. Röseler

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 333 KB

english, 1993

4

IR ellipsometry investigations of N2O-nitrided silicon oxide thin films on silicon

M. Weidner, A. Röseler, M. Eichler

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 310 KB

english, 1993

5

Spectroscopic IR ellipsometry of [100] and [001] oriented YBa2Cu3O7−δ films

E. Wold, J. Bremer, O. Hunderi

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 404 KB

english, 1993

6

IR spectroscopic ellipsometry: instrumentation and applications in semiconductors

Gilbert Zalczer, Olivier Thomas, Jean-Philippe Piel, Jean-Louis Stehlé

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 418 KB

english, 1993

7

In situ investigation by IR ellipsometry of the growth and interfaces of amorphous silicon and related materials

R. Ossikovski, H. Shirai, B. Drévillon

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 373 KB

english, 1993

8

In situ diagnosis of a-Si:H—metal interface reactions using IR spectroscopic reflectometry

Yasutake Toyoshima

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 360 KB

english, 1993

9

Multichannel polarization state detectors for time-resolved ellipsometry

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 315 KB

english, 1993

10

Spectroscopic ellipsometry under external excitation

G. Jin, H. El Rhaleb, J.P. Roger, A.C. Boccara, J.L. Stehlé

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 403 KB

english, 1993

11

Improved rotating analyser-polarizer type of scanning ellipsometer

Liang-Yao Chen, Xing-Wei Feng, Yi Su, Hong-Zhou Ma, You-Hua Qian

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 327 KB

english, 1993

12

A novel method for stabilizing the photoelastic modulator used in a polarization modulated spectroscopic ellipsometer

Tomoyuki Fukazawa, Mitsuru Sano, Yu Yoshida, Nobuyuki Sakayanagi

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 384 KB

english, 1993

13

Regression calibration method for rotating element ellipsometers

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 293 KB

english, 1993

14

Photoellipsometry: a modulation spectroscopy method applied to n-type GaAs

Yi-Ming Xiong, Paul G. Snyder, John A. Woollam

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 225 KB

english, 1993

15

High precision UV-visible-near-IR Stokes vector spectroscopy

J.-Th. Zettler, Th. Trepk, L. Spanos, Y.-Z. Hu, W. Richter

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 452 KB

english, 1993

16

A new and high precision achromatic ellipsometer: a two-channel and polarization rotator method

J. Monin, H. Sahsah, O. Brevet-Philibert

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 323 KB

english, 1993

17

Data analysis for spectroscopic ellipsometry

G.E. Jellison Jr.

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 684 KB

english, 1993

18

Numerical aspects of the implementation of effective-medium approximation models in spectroscopic ellipsometry regression software

Ph.J. Rouseel, J. Vanhellemont, H.E. Maes

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 347 KB

english, 1993

19

Ellipsometry and reflectance of inhomogeneous and anisotropic media: a new computationally efficient approach

E. Toussaere, J. Zyss

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 552 KB

english, 1993

20

Techniques for ellipsometric measurement of the thickness and optical constants of thin absorbing films

William A. McGahan, Blaine Johs, John A. Woollam

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 307 KB

english, 1993

21

Variable angle spectroscopic ellipsometry: application to poled polymers for non-linear optics

E. Toussaere, J. Zyss

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 359 KB

english, 1993

22

Modelling of ellipsometric data of inhomogeneous TiO2 films

G. Parjadis de Lariviére, J.M. Frigerio, F. Bridou, J. Rivory

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 347 KB

english, 1993

23

Optical properties of plasma polymer films (hexamethyldisiloxane)

R. Rochotzki, M. Arzt, F. Blaschta, E. Kreyβig, H.U. Poll

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 422 KB

english, 1993

24

An ellipsometric study of layered droplets

M.P. Valignat, N. Fraysse, A.M. Cazabat, F. Heslot, P. Levinson

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 252 KB

english, 1993

25

Interfacial behaviour of non-ionic surfactants at the silica-water interface revealed by ellipsometry

F. Tiberg, B. Lindman, M. Landgren

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 400 KB

english, 1993

26

An ellipsometric study of adsorption isotherms

P. Levinson, M.P. Valignat, N. Fraysse, A.M. Cazabat, F. Heslot

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 305 KB

english, 1993

27

IR spectroscopic ellipsometry: transmission studies on liquid crystals

J. Reins, E.H. Korte, A. Röseler

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 383 KB

english, 1993

28

Ellipsometric study of specular reflection from a naturally optically active medium

M.P. Silverman, J. Badoz

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 374 KB

english, 1993

29

Characterization of radiative surface modes and anisotropy in Ag/SiO2 multilayers, by visible and IR ellipsometry

A. Bichri, O. Hunderi, J. Lafait, E. Wold

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 349 KB

english, 1993

30

Spectroscopic variations of optical constant and emissivity of PtAl2O3 cermet thin films

J.P. Segaud, B. Drévillon, E. Pascual, R. Ossikovski, G. Monnier, L. Rimbourg

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 335 KB

english, 1993

31

Surface characterization of metal plates exposed to atomic oxygen in space

J.S. Brodkin, L.C. Sengupta, W. Franzen, P.L. Sagalyn

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 723 KB

english, 1993

32

Mid- and near-IR ellipsometry of Y1−xPrxBa2Cu3O7 epitaxial films

J. Humlíček, K. Kamarás, J. Kircher, H.-U. Habermeier, M. Cardona, A. Röseler, J.-L. Stehlé

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 305 KB

english, 1993

33

Spectroellipsometric study of phase transitions in d and f metals in ultrahigh vacuum

M.M. Kirillova, Yu.V. Knyazev, Yu.I. Kuzmin

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 319 KB

english, 1993

34

Optical study of the doping effect of oxygen in YBa2Cu3Oy and Bi2Sr2CaCu2O8+δ single crystals

L.V. Nomerovannaya, A.A. Makhnev, M.M. Kirillova

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 364 KB

english, 1993

35

Spectroscopic ellipsometric and magneto-optical study of Cu/Fe multilayers

Yu.V. Kudryavtsev, O.Yu. Bzhestowski, L. Smardz

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 173 KB

english, 1993

36

Optical studies of CuNi, PdNi and CoPt multilayers by conventional and synchrotron radiation ellipsometry

S. Logothetidis, J. Petalas, N.K. Flevaris, R.L. Johnson

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 396 KB

english, 1993

37

Ellipsometric spectroscopy of valence states in amorphous metallic alloys

M.U. Belyi, L.V. Poperenko, I.A. Schaikevich

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 251 KB

english, 1993

38

Spectroscopic ellipsometry on 1T-TiSe2

T. Buslaps, R.L. Johnson, G. Jungk

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 268 KB

english, 1993

39

Spectroellipsometric characterization of lanthanide-doped TiO2 films obtained via the sol-gel technique

M. Gartner, C. Parlog, P. Osiceanu

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 361 KB

english, 1993

40

Investigation of ferrite surface treatments by spectroscopic ellipsometry

M. Dancygier, L. Benitah, J.-M. Frigerio

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 402 KB

english, 1993

41

Author index of volumes 233 and 234

Journal:

Thin Solid Films

Year:

1993

File:

PDF, 117 KB

1993

42

Subject index of volume 233 and 234

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 758 KB

english, 1993

43

Editorial Board

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 54 KB

english, 1993

44

IR spectroscopic ellipsometry: instrumentation and results

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 604 KB

english, 1993

45

Far-IR spectroscopic ellipsometer

K.-L. Barth, D. Böhme, K. Kamaräs, F. Keilmann, M. Cardona

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 297 KB

english, 1993

46

Determination of the refractive index of metal/ceramic composites and their components by spectroscopic ellipsometry and effective medium theories

A. Gombert, W. Graf, A. Heinzel, R. Joerger, M. Köhl, U. Weimar

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 444 KB

english, 1993

47

Extension of spectroscopic ellipsometry to the far infrared

G. Dittmar, V. Offermann, M. Pohlen, P. Grosse

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 501 KB

english, 1993

48

Broadband spectroscopic ellipsometry based on a Fourier transform spectrometer

A. Gombert, M. Köhl, U. Weimar

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 341 KB

english, 1993

49

Peculiarities of non-linear spectroscopic ellipsometry of initially isotropic substances

Igor I. Gancheryonok, Seishiro Saikan, Takashi Kushida

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 365 KB

english, 1993

50

Spectroscopic ellipsometry: a new tool for “on line” quality control

D. Zahorski, J.L. Mariani, L. Escadafals, J. Gilles

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 433 KB

english, 1993

51

Possibilities and limitations of ellipsometry

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 300 KB

english, 1993

52

Studies on inhomogeneous transparent optical coatings on transparent substrates by spectroscopic ellipsometry

P. Chindaudom, K. Vedam

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 285 KB

english, 1993

53

Determination of the sign of δ in spectroscopic ellipsometry without a quarter-wave plate: calculation and applications

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 218 KB

english, 1993

54

Spectroscopic ellipsometry characterization of the index profile in inhomogeneous thin films

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 202 KB

english, 1993

55

Ellipsometric spectra and fractional derivative spectrum analysis of polyaniline films

D. Mo, Y.Y. Lin, J.H. Tan, Z.X. Yu, G.Z. Zhou, K.C. Gong, G.P. Zhang, X.-F. He

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 233 KB

english, 1993

56

Ellipsometry and reflectivity at the Brewster angle: tools to study the bending elasticity and phase transitions in monolayers at liquid interfaces

S. Hénon, J. Meunier

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 831 KB

english, 1993

57

Ellipsometry of ultrathin Mo and Si films

P. Široký, J. Sobota, J. Seidl, L. Jastrabík

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 256 KB

english, 1993

58

Relationship between microstructure and optical properties in high Tc superconductors

G.-J. Babonas, R. Dagys, V. Kregžd≐, G. Pukinskas, E. Belokoneva, L. Leonyuk, A. Vetkin

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 286 KB

english, 1993

59

Optical properties of the YBa cuprates: mainly a band structure point of view

J. Kircher, Sudha Gopalan, M. Cardona

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 425 KB

english, 1993

60

Specular optical activity in α-HgS

A.R. Bungay, Yu.P. Svirko, N.I. Zheludev

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 291 KB

english, 1993

61

Invisible layers in ellipsometry

E.G. Bortchagovsky, O.M. Getsko

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 309 KB

english, 1993

62

Analysis of the oxidation of polycrystalline zinc selenide by spectroscopic ellipsometry and photothermal deflection spectroscopy

E. Masetti, M. Montecchi, M.P. da Silva

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 294 KB

english, 1993