Scattering parameter approach applied to the stability...

Microelectronics Reliability 2013 / 9 Vol. 53; Iss. 9-11

Scattering parameter approach applied to the stability analysis of power IGBTs in short circuit

Abbate, C., Busatto, G., Iannuzzo, F., Ronsisvalle, C., Sanseverino, A., Velardi, F.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.128
Date:
September, 2013
File:
PDF, 3.81 MB
english, 2013
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