AFM for the imaging of large and steep submicroscopic...

AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips

G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. Plagmann
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Volume:
264
Year:
1995
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(95)05823-0
File:
PDF, 820 KB
english, 1995
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