AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips
G. Kaupp, J. Schmeyers, U. Pogodda, M. Haak, T. Marquardt, M. PlagmannVolume:
264
Year:
1995
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(95)05823-0
File:
PDF, 820 KB
english, 1995