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Volume 264; Issue 2
Main
Thin Solid Films
Volume 264; Issue 2
Thin Solid Films
Volume 264; Issue 2
1
Kinetic processes in metal epitaxy studied with variable temperature STM: Ag/Pt(111)
Harald Brune
,
Holger Röder
,
Karsten Bromann
,
Klaus Kern
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 652 KB
Your tags:
english, 1995
2
Scanning tunnelling microscopy on quenched Si(111) surfaces
L. Teufel
,
P. Heuell
,
M.A. Kulakov
,
B. Bullemer
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 416 KB
Your tags:
english, 1995
3
Normalized differential conductivity and surface density of states in simulated tunneling spectroscopy
Z. Zhang
,
B. Bullemer
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 454 KB
Your tags:
english, 1995
4
Characterization of a cantilever with an integrated deflection sensor
R. Linnemann
,
T. Gotszalk
,
L. Hadjiiski
,
I.W. Rangelow
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 770 KB
Your tags:
english, 1995
5
Application of the needle sensor for microstructure measurements and atomic force microscopy
U. Grunewald
,
K. Bartzke
,
T. Antrack
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 312 KB
Your tags:
english, 1995
6
Patterning of an electron beam resist with a scanning tunnelling microscope operating in air
K. Kragler
,
E. Günther
,
R. Leuschner
,
G. Falk
,
H. von Seggern
,
G. Saemann-Ischenko
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 495 KB
Your tags:
english, 1995
7
Scanning near-field optical lithography
S. Wegscheider
,
A. Kirsch
,
J. Mlynek
,
G. Krausch
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 541 KB
Your tags:
english, 1995
8
The atomic force microscope as a near-field probe for ultrasound
U. Rabe
,
M. Dvorak
,
W. Arnold
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 380 KB
Your tags:
english, 1995
9
Near-field optics: light for the world of nano-scale science
D.W. Pohl
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 527 KB
Your tags:
english, 1995
10
AFM for the imaging of large and steep submicroscopic features, artifacts and scraping with asymmetric cantilever tips
G. Kaupp
,
J. Schmeyers
,
U. Pogodda
,
M. Haak
,
T. Marquardt
,
M. Plagmann
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 820 KB
Your tags:
english, 1995
11
Adsorption of self-assembled monolayers of mercaptan on gold
M. Rohwerder
,
K. de Weldige
,
E. Vago
,
H. Viefhaus
,
M. Stratmann
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 921 KB
Your tags:
english, 1995
12
Thermovoltages in vacuum tunneling investigated by scanning tunneling microscopy
D.H. Hoffmann
,
A. Rettenberger
,
J.-Y. Grand
,
K. Läuger
,
P. Leiderer
,
K. Dransfeld
,
R. Möller
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 253 KB
Your tags:
english, 1995
13
Structure and dynamics of two-dimensional adlayers of a 2-pyridone smectogen studied by STM
R. Heinz
,
J.P. Rabe
,
W.-V. Meister
,
S. Hoffmann
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 576 KB
Your tags:
english, 1995
14
Force microscopical investigation of human teeth in liquids
O. Sollböhmer
,
K.-P. May
,
M. Anders
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 1.29 MB
Your tags:
english, 1995
15
Calculation of STM profiles for nanometrology
H. Sbosny
,
L. Koenders
,
M. Hietschold
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 396 KB
Your tags:
english, 1995
16
Multivariate estimation of the systematic error of scanning probe microscopes
Hendrik Rothe
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 767 KB
Your tags:
english, 1995
17
Application of neural networks to a scanning probe microscopy system
L. Hadjiiski
,
R. Linnemann
,
M. Stopka
,
E. Oesterschulze
,
I. Rangelow
,
R. Kassing
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 799 KB
Your tags:
english, 1995
18
AFM and TEM investigations of polypropylene/polyurethane blends
D. Reifer
,
R. Windeit
,
R.J. Kumpf
,
A. Karbach
,
H. Fuchs
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 643 KB
Your tags:
english, 1995
19
Application of atomic force microscopy for microindentation testing
M. Petzold
,
J. Landgraf
,
M. Füting
,
J.M. Olaf
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 1018 KB
Your tags:
english, 1995
20
The influence of experimental parameters on contrast formation in magnetic force microscopy
F. Krause
,
F. Kaisinger
,
H. Starke
,
G. Persch
,
U. Hartmann
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 670 KB
Your tags:
english, 1995
21
Nanostructures in industrial materials
K. Reihs
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 609 KB
Your tags:
english, 1995
22
Preface
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 154 KB
Your tags:
english, 1995
23
Probing of oscillating surfaces by a scanning acoustic tunneling microscope
T. Hesjedal
,
E. Chilla
,
H.-J. Fröhlich
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 424 KB
Your tags:
english, 1995
24
Author index of volume 264
Journal:
Thin Solid Films
Year:
1995
File:
PDF, 84 KB
Your tags:
1995
25
An ultra-high resolution control unit for a scanning tunnelling microscope
P. Heuell
,
S. Cuzdi
,
M.A. Kulakov
,
B. Bullemer
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 540 KB
Your tags:
english, 1995
26
Lattice-resolution AFM on the layered dichalcogenide WSe2 in the sliding regime
Th. Schimmel
,
J. Küppers
,
M. Lux-Steiner
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 597 KB
Your tags:
english, 1995
27
Modification of thin gold films with a scanning force microscope
H.W. Schumacher
,
B. Kracke
,
B. Damaschke
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 501 KB
Your tags:
english, 1995
28
Organic film formation investigated by atomic force microscopy on the nanometre scale
T. Gesang
,
R. Höper
,
S. Dieckhoff
,
V. Schiett
,
W. Possart
,
O.-D. Hennemann
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 1.31 MB
Your tags:
english, 1995
29
Optical near-field characterization of submicron structured silicon films
H. Brückl
,
H. Pagnia
,
N. Sotnik
,
Ch. Wilbertz
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 393 KB
Your tags:
english, 1995
30
1 MHz quartz length extension resonator as a probe for scanning near-field acoustic microscopy
A. Michels
,
F. Meinen
,
T. Murdfield
,
W. Göhde
,
U.C. Fischer
,
E. Beckmann
,
H. Fuchs
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 404 KB
Your tags:
english, 1995
31
Membrane characterization by means of pneumatic scanning force microscopy
H. Kamusewitz
,
M. Keller
,
D. Paul
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 3.19 MB
Your tags:
english, 1995
32
Subject index of volume 264
Journal:
Thin Solid Films
Year:
1995
Language:
english
File:
PDF, 406 KB
Your tags:
english, 1995
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