UHV RHEED system for in-situ studies of sputtered films

UHV RHEED system for in-situ studies of sputtered films

S.R. Das, L. LeBrun, P.B. Sewell, T. Tyrie
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Volume:
270
Year:
1995
Language:
english
Pages:
6
DOI:
10.1016/0040-6090(95)06750-7
File:
PDF, 622 KB
english, 1995
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