Structural characterization of ion-beam-induced epitaxially...

Structural characterization of ion-beam-induced epitaxially crystallized thin layers of III–V and IV–IV semiconductors

Naoto Kobayashi
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Volume:
270
Year:
1995
Language:
english
Pages:
7
DOI:
10.1016/0040-6090(95)06761-2
File:
PDF, 752 KB
english, 1995
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