Roughness determination of plasma-modified surface layers...

Roughness determination of plasma-modified surface layers with atomic force microscopy

N. Almqvist, M. Rubel, P. Wienhold, S. Fredriksson
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Volume:
270
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(95)06933-x
File:
PDF, 592 KB
english, 1995
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