Roughness determination of plasma-modified surface layers with atomic force microscopy
N. Almqvist, M. Rubel, P. Wienhold, S. FredrikssonVolume:
270
Year:
1995
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(95)06933-x
File:
PDF, 592 KB
english, 1995