BTI and HCI first-order aging estimation for early use in standard cell technology mapping
Butzen, P.F., Dal Bem, V., Reis, A.I., Ribas, R.P.Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.087
Date:
September, 2013
File:
PDF, 798 KB
english, 2013