Trap density characterization through low-frequency noise...

Microelectronic Engineering 2013 / 09 Vol. 109

Trap density characterization through low-frequency noise in junctionless transistors

Doria, Rodrigo Trevisoli, Trevisoli, Renan Doria, de Souza, Michelly, Pavanello, Marcelo Antonio
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Volume:
109
Language:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2013.03.090
Date:
September, 2013
File:
PDF, 1020 KB
english, 2013
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