Investigation of multilayered Ge/Si structures with varying thicknesses
NA Kiselev, OI Lebedev, AL Vasiliev, MV Antipov, AA Orlikovsky, KA Valiev, AG VasilievVolume:
46
Year:
1995
Language:
english
Pages:
8
DOI:
10.1016/0042-207x(94)00057-3
File:
PDF, 952 KB
english, 1995