Volume 46; Issue 3

Vacuum

Volume 46; Issue 3
1

CVV Auger line shapes in FeS2

Year:
1995
Language:
english
File:
PDF, 728 KB
english, 1995
2

A reliable compact ultra-high vacuum scanning tunneling microscope

Year:
1995
Language:
english
File:
PDF, 520 KB
english, 1995
5

Computer simulation of film thickness distribution in symmetrical magnet magnetron sputtering

Year:
1995
Language:
english
File:
PDF, 325 KB
english, 1995
6

Deposition and properties of titanium nitride films produced by dc reactive magnetron sputtering

Year:
1995
Language:
english
File:
PDF, 605 KB
english, 1995
7

Surface morphology of films having columnar grains

Year:
1995
Language:
english
File:
PDF, 417 KB
english, 1995
9

Development of pressure-time dependence methods for the calibration of vacuum gauges: a review

Year:
1995
Language:
english
File:
PDF, 1.63 MB
english, 1995
10

Hydrogen profiling and the stoichiometry of an a-SiNx: H film

Year:
1995
Language:
english
File:
PDF, 313 KB
english, 1995
12

Simulation of isotope effects in the sputtering of 63Cu–65Cu

Year:
1995
Language:
english
File:
PDF, 418 KB
english, 1995
14

Some recent advances in silicon microtechnology and their dependence on processing technique

Year:
1995
Language:
english
File:
PDF, 1019 KB
english, 1995
15

Study on depth profiles of hydrogen in the surface region of metal by ERDA

Year:
1995
Language:
english
File:
PDF, 269 KB
english, 1995
18

Determination of optical constants and band gaps of bilayered semiconductor films

Year:
1995
Language:
english
File:
PDF, 387 KB
english, 1995
20

Absorption tail of polycrystalline semiconductor films

Year:
1995
Language:
english
File:
PDF, 432 KB
english, 1995
21

Vacuum diary

Year:
1995
Language:
english
File:
PDF, 74 KB
english, 1995