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An efficient technique to select logic nodes for single event transient pulse-width reduction
Mahatme, Nihaar N., Chatterjee, Indranil, Patki, Akash, Limbrick, Daniel B., Bhuva, Bharat L., Schrimpf, Ronald D., Robinson, WilliamVolume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2012.07.030
Date:
January, 2013
File:
PDF, 307 KB
english, 2013