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Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure
Faurie, D., Geandier, G., Renault, P.-O., Le Bourhis, E., Thiaudière, D.Volume:
530
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.02.031
Date:
March, 2013
File:
PDF, 1.42 MB
english, 2013