Sin2 ψ analysis in thin films using 2D detectors:...

Thin Solid Films 2013 / 3 Vol. 530

Sin2 ψ analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure

Faurie, D., Geandier, G., Renault, P.-O., Le Bourhis, E., Thiaudière, D.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
530
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2012.02.031
Date:
March, 2013
File:
PDF, 1.42 MB
english, 2013
Conversion to is in progress
Conversion to is failed