Impact of Charge Trapping Layer Thickness and New Trade-Off...

IEEE Electron Device Letters 2013 / 05 Vol. 34; Iss. 5

Impact of Charge Trapping Layer Thickness and New Trade-Off in Performance Characteristics of 3-D SONOS Devices

Arreghini, Antonio, Kar, Gouri Sankar, Van den bosch, Geert, Van Houdt, Jan
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Volume:
34
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2013.2253442
Date:
May, 2013
File:
PDF, 263 KB
english, 2013
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