Interface Traps in InAs Nanowire Tunnel-FETs and...

IEEE Transactions on Electron Devices 2013 / 09 Vol. 60; Iss. 9

Interface Traps in InAs Nanowire Tunnel-FETs and MOSFETs—Part I: Model Description and Single Trap Analysis in Tunnel-FETs

Pala, Marco G., Esseni, David
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2274196
Date:
September, 2013
File:
PDF, 1.18 MB
english, 2013
Conversion to is in progress
Conversion to is failed