![](/img/cover-not-exists.png)
Impact of Buffer Layer on Atomic Layer Deposited TiAlO Alloy Dielectric Quality for Epitaxial-GaAs/Ge Device Application
Dalapati, G. K., Chia, C. K., Mahata, C., Krishnamoorthy, S., Tan, C. C., Tan, H. R., Maiti, Chinmay Kumar, Chi, DongzhiVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2012.2226243
Date:
January, 2013
File:
PDF, 1.89 MB
english, 2013