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Analysis of Charge-Pumping Data for Identification of Dielectric Defects
Veksler, Dmitry, Bersuker, Gennadi, Koudymov, Alexey, Liehr, MaximilianVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2249070
Date:
May, 2013
File:
PDF, 934 KB
english, 2013