Analysis of Charge-Pumping Data for Identification of...

IEEE Transactions on Electron Devices 2013 / 05 Vol. 60; Iss. 5

Analysis of Charge-Pumping Data for Identification of Dielectric Defects

Veksler, Dmitry, Bersuker, Gennadi, Koudymov, Alexey, Liehr, Maximilian
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2249070
Date:
May, 2013
File:
PDF, 934 KB
english, 2013
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