Volume 60; Issue 5

IEEE Transactions on Electron Devices

Volume 60; Issue 5

1

Analysis of Long-Periodic Permanent Magnet Structures for Electron Beam Focusing

Santra, Mrityunjay, Kumar, Lalit, Balakrishnan, Jyothi

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 650 KB

english, 2013

2

Modulation of Multidomain in AlGaN/GaN HEMT-Like Planar Gunn Diode

Wang, Ying, Yang, Lin-An, Mao, Wei, Long, Shuang, Hao, Yue

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 984 KB

english, 2013

3

RF CMOS Integrated On-Chip Tunable Absorptive Bandstop Filter Using Q-Tunable Resonators

Kim, Byungguk, Lee, Jangjoon, Lee, Juseop, Jung, Byunghoo, Chappell, William J.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.40 MB

english, 2013

4

A Closed-Form Charge Control Model for the Threshold Voltage of Depletion- and Enhancement-Mode AlGaN/GaN Devices

Wang, Zhigang, Zhang, Bo, Chen, Wanjun, Li, Zhaoji

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 2.04 MB

english, 2013

5

Cryogenic Performance of Low-Noise InP HEMTs: A Monte Carlo Study

Rodilla, Helena, Schleeh, Joel, Nilsson, Per-Ake, Wadefalk, Niklas, Mateos, Javier, Grahn, Jan

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.08 MB

english, 2013

6

An LT-GaAs Terahertz Photoconductive Antenna With High Emission Power, Low Noise, and Good Stability

Hou, Lei, Shi, Wei

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 321 KB

english, 2013

7

Design and RF Characterization of W-band Meander-Line and Folded-Waveguide Slow-Wave Structures for TWTs

Sumathy, Murugan, Augustin, Deepu, Datta, Subrata Kumar, Christie, Latha, Kumar, Lalit

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 917 KB

english, 2013

8

Design and Analysis of Analog Performance of Dual-k Spacer Underlap N/P-FinFET at 12 nm Gate Length

Nandi, Ashutosh, Saxena, Ashok K., Dasgupta, Sudeb

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 638 KB

english, 2013

9

Enhanced Performance of PDPP3T/${\rm PC}_{60}{\rm BM}$ Solar Cells Using High Boiling Solvent and UV - Ozone Treatment

Adhikary, Prajwal, Venkatesan, Swaminathan, Maharjan, Purna P., Galipeau, David, Qiao, Qiquan

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 942 KB

english, 2013

10

Comparative Study of Uniform Versus Supersteep Retrograde MOSFET Channel Doping and Implications for 6-T SRAM Yield

Damrongplasit, Nattapol, Xu, Nuo, Takeuchi, Hideki, Stephenson, Robert J., Cody, Nyles W., Yiptong, Augustin, Huang, Xiangyang, Hytha, Marek, Mears, Robert J., Liu, Tsu-Jae King

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 421 KB

english, 2013

11

Vertical Power ${\rm H}k$-MOSFET of Hexagonal Layout

Lyu, Xinjiang, Chen, Xingbi

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 886 KB

english, 2013

12

Nanometric CMOS-SOI-NEMS Transistor for Uncooled THz Sensing

Nemirovsky, Yael, Svetlitza, Alexander, Brouk, Igor, Stolyarova, Sara

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 930 KB

english, 2013

13

Kinetic Stress Testing and the Influence of Long-Time Anneals on the Behavior of IZO Thin Film Transistors

Vemuri, Rajitha N. P., Marrs, Michael A., Alford, Terry L.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 842 KB

english, 2013

14

Analytical Gate Capacitance Modeling of III–V Nanowire Transistors

Marin, Enrique G., Ruiz, Francisco J. Garcia, Tienda-Luna, Isabel Maria, Godoy, Andres, Gamiz, Francisco

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 929 KB

english, 2013

15

Use of Amorphous Silicon for Active Photonic Devices

Della Corte, Francesco Giuseppe, Rao, Sandro

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1023 KB

english, 2013

16

Analysis of Charge-Pumping Data for Identification of Dielectric Defects

Veksler, Dmitry, Bersuker, Gennadi, Koudymov, Alexey, Liehr, Maximilian

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 934 KB

english, 2013

17

Performances of Strained Nanowire Devices: Ballistic Versus Scattering-Limited Currents

Nguyen, Viet-Hung, Triozon, Francois, Bonnet, Frederic D. R., Niquet, Yann-Michel

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 916 KB

english, 2013

18

Performance and Reliability of ${\rm Gd}_{2}{\rm O}_{3}$ and Stacked ${\rm Gd}_{2}{\rm O}_{3}\hbox{-}{\rm Eu}_{2}{\rm O}_{3}$ Metal-Insulator-Metal Capacitors

Padmanabhan, Revathy, Bhat, Navakanta, Mohan, Sangeneni

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.30 MB

english, 2013

19

Sub-400$^{\circ}{\rm C}~{\rm Si}_{2}{\rm H}_{6}$ Passivation, ${\rm HfO}_{2}$ Gate Dielectric, and Single TaN Metal Gate: A Common Gate Stack Technology for ${\rm In}_{0.7}{\rm Ga}_{0.3}{\rm As}$ and ${\rm Ge}_{1-x}{\rm Sn}_{x}$ CMOS

Gong, Xiao, Han, Genquan, Liu, Bin, Wang, Lanxiang, Wang, Wei, Yang, Yue, Kong, Eugene Yu-Jin, Su, Shaojian, Xue, Chunlai, Cheng, Buwen, Yeo, Yee-Chia

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.95 MB

english, 2013

20

Transient Analysis of Partial Thermal Characteristics of Multistructure Power LEDs

Wang, Chien-Ping, Chen, Tzung-Te, Fu, Han-Kuei, Chang, Tien-Li, Chou, Pei-Ting

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 987 KB

english, 2013

21

Large Active Area Organic Photodiodes for Short-Pulse X-Ray Detection

Arca, Francesco, Kohlstadt, Eduard, Tedde, Sandro F., Lugli, Paolo, Hayden, Oliver

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.43 MB

english, 2013

22

Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors

Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Yu-Te, Liao, Po-Yung, Chen, Te-Chih, Tsai, Ming-Yen, Chen, Yu-Chun, Chen, Bo-Wei, Chu, Ann-Kuo, Chou, Cheng-Hsu, Chung, Wang-Cheng, Chang, Jung-Fang

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.71 MB

english, 2013

23

CMOS Pixels Directly Sensitive to Both Visible and Near-Infrared Radiation

Langfelder, Giacomo

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 831 KB

english, 2013

24

Behavioral Circuit Model of Active-Matrix Liquid Crystal Display With Charge-Shared Pixel Structure

Kim, Jong-Man, Cho, Youngmin, Lee, Seung-Hyuck, Kim, Jongbin, Lee, Seung-Woo

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.17 MB

english, 2013

25

Channel Length-Dependent Charge Detrapping on Threshold Voltage Shift of Amorphous InGaZnO TFTs Under Dynamic Bias Stress

Park, Suehye, Cho, Edward Namkyu, Yun, Ilgu

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.05 MB

english, 2013

26

Characterization of Backside-Illuminated CMOS APS Prototypes for the Extreme Ultraviolet Imager On-Board Solar Orbiter

BenMoussa, Ali, Giordanengo, Boris, Gissot, Samuel, Meynants, Guy, Wang, Xinyang, Wolfs, Bram, Bogaerts, Jan, Schuhle, Udo, Berger, Guy, Gottwald, Alexander, Laubis, Christian, Kroth, Udo, Scholze, Fr

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 882 KB

english, 2013

27

Analysis of Random Telegraph Noise in 45-nm CMOS Using On-Chip Characterization System

Realov, Simeon, Shepard, Kenneth L.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 897 KB

english, 2013

28

Performance Improvement of a 0.18-$\mu{\rm m}$ CMOS Microwave Amplifier Using Micromachined Suspended Inductors: Theory and Experiment

Wang, To-Po, Li, Zong-Wei, Tsai, Hung-Yu

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 972 KB

english, 2013

29

Energy Distribution of Positive Charges in Gate Dielectric: Probing Technique and Impacts of Different Defects

Hatta, Sharifah Wan Muhamad, Ji, Zhigang, Zhang, Jian Fu, Duan, Meng, Zhang, Wei Dong, Soin, Norhayati, Kaczer, Ben, De Gendt, Stefan, Groeseneken, Guido

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 927 KB

english, 2013

30

Simple Noise Margin Model for Optimal Design of Unipolar Thin-Film Transistor Logic Circuits

Cui, Qingyu, Si, Mengwei, Sporea, Radu A., Guo, Xiaojun

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 421 KB

english, 2013

31

Microscopic Modeling of Electrical Stress-Induced Breakdown in Poly-Crystalline Hafnium Oxide Dielectrics

Vandelli, Luca, Padovani, Andrea, Larcher, Luca, Bersuker, Gennadi

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 2.19 MB

english, 2013

32

Measurement and Modeling of Thermal Behavior in InGaP/GaAs HBTs

Sevimli, Oya, Parker, Anthony E., Fattorini, Anthony P., Mahon, Simon J.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 2.06 MB

english, 2013

33

Modeling of Parasitic Fringing Capacitance in Multifin Trigate FinFETs

Lee, KwangWon, An, TaeYoon, Joo, SoYeon, Kwon, Kee-Won, Kim, SoYoung

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 756 KB

english, 2013

34

High-Performance Ultrathin Body c-SiGe Channel FDSOI pMOSFETs Featuring SiGe Source and Drain: $V_{\rm th}$ Tuning, Variability, Access Resistance, and Mobility Issues

Villalon, Anthony, Le Royer, Cyrille, Cristoloveanu, Sorin, Casse, Mickael, Cooper, David, Mazurier, Jerome, Previtali, Bernard, Tabone, Claude, Perreau, Pierre, Hartmann, Jean-Michel, Scheiblin, Pasc

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.20 MB

english, 2013

35

Improvement of the Anneal-Induced Valence Band Offset Variation by the Hybrid Deposition of ${\rm HfO}_{2}$ on Si

Fan, Jibin, Liu, Hongxia, Ma, Fei, Hao, Yue

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 496 KB

english, 2013

36

Analog/RF Performance and Optimization of Vertical III–V Double-Gate Transistor

Shih, Kun-Huan, Chui, Chi On

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.41 MB

english, 2013

37

Computational Analysis of Rupture-Oxide Phase-Change Memory Cells

Kan'an, Nadim, Faraclas, Azer, Williams, Nicholas, Silva, Helena, Gokirmak, Ali

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.43 MB

english, 2013

38

Ultra Low Power Junctionless MOSFETs for Subthreshold Logic Applications

Parihar, Mukta Singh, Ghosh, Dipankar, Kranti, Abhinav

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 966 KB

english, 2013

39

Geometry, Temperature, and Body Bias Dependence of Statistical Variability in 20-nm Bulk CMOS Technology: A Comprehensive Simulation Analysis

Wang, Xingsheng, Adamu-Lema, Fikru, Cheng, Binjie, Asenov, Asen

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 2.81 MB

english, 2013

40

Dimension Dependence of Unusual HCI-Induced Degradation on N-Channel High-Voltage DEMOSFET

Chou, Hsueh-Liang, Huang, Chih-Fang, Gong, Jeng

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 1.67 MB

english, 2013

41

3D Finite Element Monte Carlo Simulations of Multigate Nanoscale Transistors

Aldegunde, Manuel, Garcia-Loureiro, Antonio Jesus, Kalna, Karol

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 906 KB

english, 2013

42

Electrical Characteristics of ${\rm Al}_{2}{\rm O}_{3}/{\rm InSb}$ MOSCAPs and the Effect of Postdeposition Annealing Temperatures

Trinh, Hai Dang, Lin, Yueh Chin, Chang, Edward Yi, Lee, Ching-Ting, Wang, Shin-Yuan, Nguyen, Hong Quan, Chiu, Yu Sheng, Luc, Quang Ho, Chang, Hui-Chen, Lin, Chun-Hsiung, Jang, Simon, Diaz, Carlos H.

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 809 KB

english, 2013

43

Impact of Different Barrier Layers and Indium Content of the Channel on the Analog Performance of InGaAs MOSFETs

Tewari, Suchismita, Biswas, Abhijit, Mallik, Abhijit

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 665 KB

english, 2013

44

Table of contents

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 155 KB

english, 2013

45

Special section on advanced manufactring of wide band gap (WBG) semiconductor products

Journal:

IEEE Transactions on Electron Devices

Year:

2013

File:

PDF, 258 KB

2013

46

[Blank page - back cover]

Journal:

IEEE Transactions on Electron Devices

Year:

2013

File:

PDF, 8 KB

2013

47

IEEE Transactions on Electron Devices information for authors

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 105 KB

english, 2013

48

IEEE Transactions on Electron Devices publication information

Journal:

IEEE Transactions on Electron Devices

Year:

2013

Language:

english

File:

PDF, 152 KB

english, 2013

49

Special issue on advanced FET compact models for future technology generations

Journal:

IEEE Transactions on Electron Devices

Year:

2013

File:

PDF, 312 KB

2013

50

Special issue on vacuum electronic devices

Journal:

IEEE Transactions on Electron Devices

Year:

2013

File:

PDF, 236 KB

2013

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