Characterization and Investigation of a Hot-Carrier Effect...

IEEE Transactions on Electron Devices 2013 / 05 Vol. 60; Iss. 5

Characterization and Investigation of a Hot-Carrier Effect in Via-Contact Type a-InGaZnO Thin-Film Transistors

Hsieh, Tien-Yu, Chang, Ting-Chang, Chen, Yu-Te, Liao, Po-Yung, Chen, Te-Chih, Tsai, Ming-Yen, Chen, Yu-Chun, Chen, Bo-Wei, Chu, Ann-Kuo, Chou, Cheng-Hsu, Chung, Wang-Cheng, Chang, Jung-Fang
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2253611
Date:
May, 2013
File:
PDF, 1.71 MB
english, 2013
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