Analysis of Random Telegraph Noise in 45-nm CMOS Using...

IEEE Transactions on Electron Devices 2013 / 05 Vol. 60; Iss. 5

Analysis of Random Telegraph Noise in 45-nm CMOS Using On-Chip Characterization System

Realov, Simeon, Shepard, Kenneth L.
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2013.2254118
Date:
May, 2013
File:
PDF, 897 KB
english, 2013
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