Slew-Rate Monitoring Circuit for On-Chip Process Variation...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2013 / 09 Vol. 21; Iss. 9

Slew-Rate Monitoring Circuit for On-Chip Process Variation Detection

Ghosh, Amlan, Rao, Rahul M., Kim, Jae-Joon, Chuang, Ching-Te, Brown, Richard B.
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Volume:
21
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2012.2218838
Date:
September, 2013
File:
PDF, 855 KB
english, 2013
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