Application of the channeling and X-ray diffraction...

Application of the channeling and X-ray diffraction techniques for defect analysis

R. Kaufmann, G. Linker, O. Meyer
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Volume:
218
Year:
1983
Language:
english
Pages:
5
DOI:
10.1016/0167-5087(83)91058-x
File:
PDF, 404 KB
english, 1983
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