Volume 218; Issue 1-3

1

Editorial Board

Year:
1983
Language:
english
File:
PDF, 26 KB
english, 1983
2

Preface

Year:
1983
Language:
english
File:
PDF, 82 KB
english, 1983
8

Non-vacuum Rutherford backscattering spectrometry

Year:
1983
Language:
english
File:
PDF, 288 KB
english, 1983
13

Depth profiles and microtopology

Year:
1983
Language:
english
File:
PDF, 275 KB
english, 1983
30

Simultaneous high depth resolution profiling of carbon and oxygen

Year:
1983
Language:
english
File:
PDF, 335 KB
english, 1983
37

High energy ion microprobes

Year:
1983
Language:
english
File:
PDF, 499 KB
english, 1983
41

BATTY83: A computer program for thick target PIXE analysis

Year:
1983
Language:
english
File:
PDF, 270 KB
english, 1983
49

Biomolecule mass spectrometry by fast heavy ion induced desorption

Year:
1983
Language:
english
File:
PDF, 477 KB
english, 1983
58

The velocity dependence of secondary ion fields

Year:
1983
Language:
english
File:
PDF, 331 KB
english, 1983
62

Ionization of atoms sputtered from AIIIBV compounds

Year:
1983
Language:
english
File:
PDF, 251 KB
english, 1983
64

Liquid metal ion sources: Mechanism and applications

Year:
1983
Language:
english
File:
PDF, 426 KB
english, 1983
65

Applications of focused ion beams

Year:
1983
Language:
english
File:
PDF, 878 KB
english, 1983
68

SIMS micro-analysis with a gallium ion microprobe

Year:
1983
Language:
english
File:
PDF, 1.28 MB
english, 1983
73

PIXE analysis of compound materials

Year:
1983
Language:
english
File:
PDF, 331 KB
english, 1983
76

Accelerator mass spectrometry with 26Al

Year:
1983
Language:
english
File:
PDF, 662 KB
english, 1983
80

Li, B and N in ancient materials

Year:
1983
Language:
english
File:
PDF, 428 KB
english, 1983
81

Accelerator based mass spectrometry of semiconductor materials

Year:
1983
Language:
english
File:
PDF, 344 KB
english, 1983
91

Elemental analysis of algae with PIXE and PIGME

Year:
1983
Language:
english
File:
PDF, 338 KB
english, 1983
92

The PIGME method for fluorine determination

Year:
1983
Language:
english
File:
PDF, 255 KB
english, 1983
99

Oxygen and hydrogen on the surface of diamond

Year:
1983
Language:
english
File:
PDF, 236 KB
english, 1983
100

Ion sputtered deposit analysis by electron microscopy

Year:
1983
Language:
english
File:
PDF, 220 KB
english, 1983
105

Channeling analysis of thermally nitrided silicon

Year:
1983
Language:
english
File:
PDF, 258 KB
english, 1983
110

Ion beam analysis of defect trapping

Year:
1983
Language:
english
File:
PDF, 962 KB
english, 1983
121

Surface modification using MeV ion beams

Year:
1983
Language:
english
File:
PDF, 502 KB
english, 1983
130

The creation of surface damage by ion-beam bombardment

Year:
1983
Language:
english
File:
PDF, 1.48 MB
english, 1983
139

Ion-electron emission from magnetostrictive alloy

Year:
1983
Language:
english
File:
PDF, 86 KB
english, 1983
144

Heavy ion energy straggling

Year:
1983
Language:
english
File:
PDF, 319 KB
english, 1983
148

Author index

Year:
1983
Language:
english
File:
PDF, 662 KB
english, 1983