CW and time resolved luminescence study of dry etch damage in semiconductor wires
B.E. Maile, G. Mayer, R. Germann, A. Forchel, H.P. MeierVolume:
11
Year:
1990
Pages:
4
DOI:
10.1016/0167-9317(90)90178-v
File:
PDF, 195 KB
1990