On-water picosecond e-beam testing applied to complex high-speed IC's
D. Winkler, R. Schmitt, M. Brunner, J.M. DortuVolume:
11
Year:
1990
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(90)90190-5
File:
PDF, 347 KB
english, 1990