Application of a linear scaling factor for modeling I-V-characteristics of submicron MOSFETs with channel lengths down to 0.4 μm
H.-J. Wildau, F. Scheidemantel, H.G. WagemannVolume:
15
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(91)90218-3
File:
PDF, 187 KB
english, 1991