The effects of scaling and rapid thermal annealing on the...

Microelectronic Engineering 1991 Vol. 15; Iss. 1-4

The effects of scaling and rapid thermal annealing on the 1/∫ noise of polysilicon emitter bipolar transistors

N. Siabi-Shahrivar, H.A. Kemhadjian, W. Redman-White, P. Ashburn, J.D. Williams
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Volume:
15
Year:
1991
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(91)90278-l
File:
PDF, 210 KB
english, 1991
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