Electrical characterization versus temperature of SI MOS...

Electrical characterization versus temperature of SI MOS transistors with plasma nitrided gate oxide

A. Emrani, G. Ghibaudo, F. Balestra, B. Piot, V. Thirion, A. Straboni
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Volume:
22
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(93)90137-t
File:
PDF, 281 KB
english, 1993
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