![](/img/cover-not-exists.png)
Electrical characterization versus temperature of SI MOS transistors with plasma nitrided gate oxide
A. Emrani, G. Ghibaudo, F. Balestra, B. Piot, V. Thirion, A. StraboniVolume:
22
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0167-9317(93)90137-t
File:
PDF, 281 KB
english, 1993