Physical characterization of OMVPE-grown AlxGa1-xAs multi-layer films by means of non-destructive optical reflectometry
Pieter L. Swart, Beatrys M. Lacquet, Rajan ThavarVolume:
50
Year:
1991
Language:
english
Pages:
7
DOI:
10.1016/0169-4332(91)90193-n
File:
PDF, 443 KB
english, 1991