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Diagnostics of the silicon-insulator interface structure by optical second-harmonic generation
I.V. Kravetsky, L.L. Kulyuk, A.V. Micu, D.A. Shutov, E.E. Strumban, C. Cobianu, D. DascaluVolume:
63
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0169-4332(93)90104-j
File:
PDF, 193 KB
english, 1993