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SEL-UP: A CAD tool for the sensitivity analysis of...

SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up

Sterpone, L.
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Volume:
53
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.104
Date:
September, 2013
File:
PDF, 850 KB
english, 2013
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