Modeling of Parasitic Fringing Capacitance in Multifin...

IEEE Transactions on Electron Devices 2013 / 05 Vol. 60; Iss. 5

Modeling of Parasitic Fringing Capacitance in Multifin Trigate FinFETs

Lee, KwangWon, An, TaeYoon, Joo, SoYeon, Kwon, Kee-Won, Kim, SoYoung
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2252467
Date:
May, 2013
File:
PDF, 756 KB
english, 2013
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