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Computational Analysis of Rupture-Oxide Phase-Change Memory Cells
Kan'an, Nadim, Faraclas, Azer, Williams, Nicholas, Silva, Helena, Gokirmak, AliVolume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2255130
Date:
May, 2013
File:
PDF, 1.43 MB
english, 2013