Voltage Ramp Stress for Hot-Carrier Screening of Scaled...

IEEE Electron Device Letters 2012 / 06 Vol. 33; Iss. 6

Voltage Ramp Stress for Hot-Carrier Screening of Scaled CMOS Devices

Kerber, A., McMahon, W., Cartier, E.
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Volume:
33
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/led.2012.2189931
Date:
June, 2012
File:
PDF, 419 KB
english, 2012
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