Dimension Dependence of Unusual HCI-Induced Degradation on...

IEEE Transactions on Electron Devices 2013 / 05 Vol. 60; Iss. 5

Dimension Dependence of Unusual HCI-Induced Degradation on N-Channel High-Voltage DEMOSFET

Chou, Hsueh-Liang, Huang, Chih-Fang, Gong, Jeng
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Volume:
60
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2252014
Date:
May, 2013
File:
PDF, 1.67 MB
english, 2013
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