H Interacting with Intrinsic Defects in Si
Bech Nielsen, B., Hoffmann, L., Budde, M., Jones, R., Goss, J.P., Öberg, SvenVolume:
196-201
Year:
1995
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.196-201.933
File:
PDF, 406 KB
1995